Film thickness measurement system using FPGA technology
Adriana Bonilla Riaño Antonio Carlos Bannwart; Hugo Fernando Velasco Peña; Oscar Mauricio Hernandez Rodriguez; Symposium on Signal Processing, Images and Computer Vision - STSIVA (2015 : Bogotá, Colombia)
Proceedings Piscataway, NJ, USA : IEEE, 2015
Piscataway, NJ, USA IEEE 2015
Localização:
EESC - Esc. Engenharia de São Carlos
(PROD-026083 )(Acessar)