Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: magazinearticle
|
A camera-based input device for large interactive displaysMorrison, G.D.IEEE computer graphics and applications, 2005-07, Vol.25 (4), p.52-57 [Peer Reviewed Journal]United States: IEEEFull text available |
|
2 |
Material Type: magazinearticle
|
Making Bertha Drive-An Autonomous Journey on a Historic RouteZiegler, Julius ; Bender, Philipp ; Schreiber, Markus ; Lategahn, Henning ; Strauss, Tobias ; Stiller, Christoph ; Thao Dang ; Franke, Uwe ; Appenrodt, Nils ; Keller, Christoph G. ; Kaus, Eberhard ; Herrtwich, Ralf G. ; Rabe, Clemens ; Pfeiffer, David ; Lindner, Frank ; Stein, Fridtjof ; Erbs, Friedrich ; Enzweiler, Markus ; Knöppel, Carsten ; Hipp, Jochen ; Haueis, Martin ; Trepte, Maximilian ; Brenk, Carsten ; Tamke, Andreas ; Ghanaat, Mohammad ; Braun, Markus ; Joos, Armin ; Fritz, Hans ; Mock, Horst ; Hein, Martin ; Zeeb, EberhardIEEE intelligent transportation systems magazine, 2014, Vol.6 (2), p.8-20 [Peer Reviewed Journal]New York, NY: IEEEFull text available |
|
3 |
Material Type: magazinearticle
|
Drying kinetics of food materials in infrared radiation drying: A reviewDelfiya, D. S. Aniesrani ; Prashob, K. ; Murali, S. ; Alfiya, P. V. ; Samuel, Manoj P. ; Pandiselvam, R.Journal of food process engineering, 2022-06, Vol.45 (6), p.n/a [Peer Reviewed Journal]Hoboken, USA: John Wiley & Sons, IncFull text available |
|
4 |
Material Type: magazinearticle
|
Experience, Results and Lessons Learned from Automated Driving on Germany's HighwaysAeberhard, Michael ; Rauch, Sebastian ; Bahram, Mohammad ; Tanzmeister, Georg ; Thomas, Julian ; Pilat, Yves ; Homm, Florian ; Huber, Werner ; Kaempchen, NicoIEEE intelligent transportation systems magazine, 2015, Vol.7 (1), p.42-57 [Peer Reviewed Journal]IEEEFull text available |
|
5 |
Material Type: magazinearticle
|
A convolutional neural network‐based comparative study for pepper seed classification: Analysis of selected deep features with support vector machineSabanci, Kadir ; Aslan, Muhammet Fatih ; Ropelewska, Ewa ; Unlersen, Muhammed FahriJournal of food process engineering, 2022-06, Vol.45 (6), p.n/a [Peer Reviewed Journal]Hoboken, USA: John Wiley & Sons, IncFull text available |
|
6 |
Material Type: magazinearticle
|
The effect of ultrasound pre‐treatment on quality, drying, and thermodynamic attributes of almond kernel under convective dryer using ANNs and ANFIS networkKaveh, Mohammad ; Jahanbakhshi, Ahmad ; Abbaspour‐Gilandeh, Yousef ; Taghinezhad, Ebrahim ; Moghimi, Mohammad Bagher FarshbafJournal of food process engineering, 2018-11, Vol.41 (7), p.n/a [Peer Reviewed Journal]Hoboken, USA: John Wiley & Sons, IncFull text available |
|
7 |
Material Type: magazinearticle
|
Relocation Strategies and Algorithms for Free-Floating Car Sharing SystemsWeikl, Simone ; Bogenberger, KlausIEEE intelligent transportation systems magazine, 2013, Vol.5 (4), p.100-111 [Peer Reviewed Journal]New York, NY: IEEEFull text available |
|
8 |
Material Type: magazinearticle
|
Nondestructive identification of barley seeds variety using near‐infrared hyperspectral imaging coupled with convolutional neural networkSingh, Tarandeep ; Garg, Neerja Mittal ; Iyengar, S. R. S.Journal of food process engineering, 2021-10, Vol.44 (10), p.n/a [Peer Reviewed Journal]Hoboken, USA: John Wiley & Sons, IncFull text available |
|
9 |
Material Type: magazinearticle
|
Design, development, and drying kinetics of infrared‐assisted hot air dryer for turmeric slicesJeevarathinam, G. ; Pandiselvam, R. ; Pandiarajan, T. ; Preetha, P. ; Krishnakumar, T. ; Balakrishnan, M. ; Thirupathi, V. ; Ganapathy, S. ; Amirtham, D.Journal of food process engineering, 2022-06, Vol.45 (6), p.n/a [Peer Reviewed Journal]Hoboken, USA: John Wiley & Sons, IncFull text available |
|
10 |
Material Type: magazinearticle
|
Channel Estimation Schemes for IEEE 802.11p StandardZijun Zhao ; Xiang Cheng ; Miaowen Wen ; Bingli Jiao ; Cheng-Xiang WangIEEE intelligent transportation systems magazine, 2013, Vol.5 (4), p.38-49 [Peer Reviewed Journal]New York, NY: IEEEFull text available |