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1 |
Material Type: Livro
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Transmission Electron Microscopy: A Textbook for Materials ScienceWilliams, David B ; Carter, C. BarryNew York, NY: Springer 1996Texto completo disponível |
2 |
Material Type: Artigo
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NCO–, a Key Fragment Upon Dissociative Electron Attachment and Electron Transfer to Pyrimidine Bases: Site Selectivity for a Slow Decay Processda Silva, Filipe Ferreira ; Matias, Carolina ; Almeida, Diogo ; García, Gustavo ; Ingólfsson, Oddur ; Flosadóttir, Helga Dögg ; Ómarsson, Benedikt ; Ptasinska, Sylwia ; Puschnigg, Benjamin ; Scheier, Paul ; Limão-Vieira, Paulo ; Denifl, StephanJournal of the American Society for Mass Spectrometry, 2013-11, Vol.24 (11), p.1787-1797 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
3 |
Material Type: Artigo
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Characterization of deformation structures in P-22 Cr–Mo steel through electron backscatter diffraction and transmission electron microscopyBhattacharyya, Dhriti ; Drew, Michael ; Humphries, S. R. ; Payten, WarwickJournal of materials science, 2023-07, Vol.58 (27), p.11286-11309 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
4 |
Material Type: Artigo
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Revealing momentum-dependent electron–phonon and phonon–phonon coupling in complex materials with ultrafast electron diffuse scatteringDürr, Hermann A. ; Ernstorfer, Ralph ; Siwick, Bradley J.MRS bulletin, 2021, Vol.46 (8), p.731-737 [Periódico revisado por pares]Cham: Springer International PublishingTexto completo disponível |
5 |
Material Type: Artigo
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Magnetoconductivity behaviour due to electron–electron interactions, weak localization and Zeeman effects in 2-D-layered WS2Mounir, El Hassan ; Mabchour, Hamza ; Hammou, Brahim Ait ; El Oujdi, Abdellatif ; Dlimi, Said ; El Kaaouachi, AbdelhamidBulletin of materials science, 2024-07, Vol.47 (3), p.161, Article 161 [Periódico revisado por pares]Bangalore: Indian Academy of SciencesTexto completo disponível |
6 |
Material Type: Artigo
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Creep Behavior of a High-γ′ Ni-Based Superalloy Fabricated via Electron Beam MeltingFernandez-Zelaia, Patxi ; Acevedo, Obed D. ; Kirka, Michael M. ; Leonard, Donovan ; Yoder, Sean ; Lee, YousubMetallurgical and materials transactions. A, Physical metallurgy and materials science, 2021-02, Vol.52 (2), p.574-590 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
7 |
Material Type: Livro
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Practical Scanning Electron Microscopy: Electron and Ion Microprobe AnalysisGoldstein, JosephNew York, NY: Springer 1975Texto completo disponível |
8 |
Material Type: Artigo
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Modern Scanning Electron Microscopy. 3. Electron ProbeNovikov, Yu. A.Surface investigation, x-ray, synchrotron and neutron techniques, 2024-02, Vol.18 (1), p.185-209 [Periódico revisado por pares]Moscow: Pleiades PublishingTexto completo disponível |
9 |
Material Type: Artigo
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Strategies to overcome electron-beam issues in liquid phase TEM: Study of chemical processesZheng, Wenjing ; Lee, Daewon ; Zheng, HaimeiMRS bulletin, 2024-03, Vol.49 (3), p.205-213 [Periódico revisado por pares]Cham: Springer International PublishingTexto completo disponível |
10 |
Material Type: Artigo
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Role of Electron–Ion Dissociative Recombination in CH4 Microwave Plasma on Basis of Simulations and Measurements of Electron EnergyMinea, T. ; van de Steeg, A. W. ; Wolf, B. ; da Silva, A. S. ; Peeters, F. J. J. ; van den Bekerom, D. C. M. ; Butterworth, T. ; Ong, Q. ; van de Sanden, M. C. M. ; van Rooij, G. J.Plasma chemistry and plasma processing, 2019-09, Vol.39 (5), p.1275-1289 [Periódico revisado por pares]New York: Springer USTexto completo disponível |