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Atomic modeling and spectroscopic diagnostics (invited)
Atomic modeling and spectroscopic diagnostics (invited)
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Atomic modeling and spectroscopic diagnostics (invited)

von Hellermann, M. G. ; Summers, H. P.

Review of Scientific Instruments, 1992-10, Vol.63 (10), p.5132-5139 [Periódico revisado por pares]

WOODBURY: Amer Inst Physics

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2
Magnetic susceptibility of some materials used for apparatus construction (at 295 K)
Magnetic susceptibility of some materials used for apparatus construction (at 295 K)
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Magnetic susceptibility of some materials used for apparatus construction (at 295 K)

Keyser, Paul T. ; Jefferts, Steven R.

Review of scientific instruments, 1989-08, Vol.60 (8), p.2711-2714 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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3
Straight Edge Profile Analysis by the Diffractographic Method with Application to Razor Blades
Straight Edge Profile Analysis by the Diffractographic Method with Application to Razor Blades
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Straight Edge Profile Analysis by the Diffractographic Method with Application to Razor Blades

Hageniers, O. L. ; Pryor, T. R. ; Pastorius, W. J. ; North, W. P. T.

Review of scientific instruments, 1972-11, Vol.43 (11), p.1688-1691 [Periódico revisado por pares]

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4
Photoacoustic calorimetry system for glancing incidence mirror absorptance measurements
Photoacoustic calorimetry system for glancing incidence mirror absorptance measurements
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Photoacoustic calorimetry system for glancing incidence mirror absorptance measurements

Kimura, W. D. ; Ford, D. H.

Review of scientific instruments, 1986-11, Vol.57 (11), p.2754-2762 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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5
Nd:YAG laser microprobe system for Fourier‐transform ion cyclotron resonance mass spectrometry
Nd:YAG laser microprobe system for Fourier‐transform ion cyclotron resonance mass spectrometry
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Nd:YAG laser microprobe system for Fourier‐transform ion cyclotron resonance mass spectrometry

Brenna, J. T. ; Creasy, W. R. ; McBain, William ; Soria, Cesar

Review of scientific instruments, 1988-06, Vol.59 (6), p.873-879 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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6
Solid‐state bonding of accurately oriented metal/ceramic bicrystals in ultrahigh vacuum
Solid‐state bonding of accurately oriented metal/ceramic bicrystals in ultrahigh vacuum
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Solid‐state bonding of accurately oriented metal/ceramic bicrystals in ultrahigh vacuum

Fischmeister, H. F. ; Elssner, G. ; Gibbesch, B. ; Kadow, K.‐H. ; Kawa, F. ; Korn, D. ; Mader, W. ; Turwitt, M.

Review of scientific instruments, 1993-01, Vol.64 (1), p.234-242 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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7
Cryostat for generating pressures to 100 kilobar and temperatures to 0.03 K
Cryostat for generating pressures to 100 kilobar and temperatures to 0.03 K
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Cryostat for generating pressures to 100 kilobar and temperatures to 0.03 K

Webb, A. W. ; Gubser, D. U. ; Towle, L. C.

Review of scientific instruments, 1976-01, Vol.47 (1), p.59-62 [Periódico revisado por pares]

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8
Surface potential probe operated at 77 K with nanosecond response
Surface potential probe operated at 77 K with nanosecond response
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Surface potential probe operated at 77 K with nanosecond response

van Welzenis, R. G. ; de Zeeuw, W. C.

Review of scientific instruments, 1977-10, Vol.48 (10), p.1326-1332 [Periódico revisado por pares]

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9
X‐Ray Determination of Stresses in Thin Films and Substrates by Automatic Bragg Angle Control
X‐Ray Determination of Stresses in Thin Films and Substrates by Automatic Bragg Angle Control
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X‐Ray Determination of Stresses in Thin Films and Substrates by Automatic Bragg Angle Control

Rozgonyi, G. A. ; Ciesielka, T. J.

Review of scientific instruments, 1973-01, Vol.44 (8), p.1053-1057 [Periódico revisado por pares]

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10
Fabrication techniques for microdevices in soft superconductors
Fabrication techniques for microdevices in soft superconductors
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Fabrication techniques for microdevices in soft superconductors

Berchier, Jean‐Luc ; Sanchez, Daniel H.

Review of scientific instruments, 1978-10, Vol.49 (10), p.1452-1459 [Periódico revisado por pares]

United States

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