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Power-Efficient Pipelined Multiprocessor Architecture With Parallel Trace-Back Mechanism for Multiple Pairwise Sequence Alignment
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Power-Efficient Pipelined Multiprocessor Architecture With Parallel Trace-Back Mechanism for Multiple Pairwise Sequence Alignment

Sarkar, Ardhendu ; Ghosh, Surajeet

IEEE transactions on computer-aided design of integrated circuits and systems, 2024-08, Vol.43 (8), p.2365-2378 [Periódico revisado por pares]

New York: IEEE

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2
Caffeine: Toward Uniformed Representation and Acceleration for Deep Convolutional Neural Networks
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Caffeine: Toward Uniformed Representation and Acceleration for Deep Convolutional Neural Networks

Zhang, Chen ; Sun, Guangyu ; Fang, Zhenman ; Zhou, Peipei ; Pan, Peichen ; Cong, Jason

IEEE transactions on computer-aided design of integrated circuits and systems, 2019-11, Vol.38 (11), p.2072-2085 [Periódico revisado por pares]

New York: IEEE

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3
ARMISTICE: Microarchitectural Leakage Modeling for Masked Software Formal Verification
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ARMISTICE: Microarchitectural Leakage Modeling for Masked Software Formal Verification

Grandmaison, Arnaud de ; Heydemann, Karine ; Meunier, Quentin L.

IEEE transactions on computer-aided design of integrated circuits and systems, 2022-11, Vol.41 (11), p.3733-3744 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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4
GCIM: Toward Efficient Processing of Graph Convolutional Networks in 3D-Stacked Memory
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GCIM: Toward Efficient Processing of Graph Convolutional Networks in 3D-Stacked Memory

Chen, Jiaxian ; Lin, Yiquan ; Sun, Kaoyi ; Chen, Jiexin ; Ma, Chenlin ; Mao, Rui ; Wang, Yi

IEEE transactions on computer-aided design of integrated circuits and systems, 2022-11, Vol.41 (11), p.3579-3590 [Periódico revisado por pares]

New York: IEEE

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A systematic mapping study: The new age of software architecture from monolithic to microservice architecture—awareness and challenges
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A systematic mapping study: The new age of software architecture from monolithic to microservice architecture—awareness and challenges

Razzaq, Abdul ; Ghayyur, Shahbaz A. K.

Computer applications in engineering education, 2023-03, Vol.31 (2), p.421-451 [Periódico revisado por pares]

Hoboken: Wiley Subscription Services, Inc

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6
Hybrid-DBT: Hardware/Software Dynamic Binary Translation Targeting VLIW
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Hybrid-DBT: Hardware/Software Dynamic Binary Translation Targeting VLIW

Rokicki, Simon ; Rohou, Erven ; Derrien, Steven

IEEE transactions on computer-aided design of integrated circuits and systems, 2019-10, Vol.38 (10), p.1872-1885 [Periódico revisado por pares]

IEEE

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7
Clustering in sensor networks: A literature survey
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Clustering in sensor networks: A literature survey

Afsar, M. Mehdi ; Tayarani-N, Mohammad-H.

Journal of network and computer applications, 2014-11, Vol.46, p.198-226 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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8
ASSURED: Architecture for Secure Software Update of Realistic Embedded Devices
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ASSURED: Architecture for Secure Software Update of Realistic Embedded Devices

Asokan, N. ; Nyman, Thomas ; Rattanavipanon, Norrathep ; Sadeghi, Ahmad-Reza ; Tsudik, Gene

IEEE transactions on computer-aided design of integrated circuits and systems, 2018-11, Vol.37 (11), p.2290-2300 [Periódico revisado por pares]

New York: IEEE

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9
Evaluating Docker for Lightweight Virtualization of Distributed and Time-Sensitive Applications in Industrial Automation
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Evaluating Docker for Lightweight Virtualization of Distributed and Time-Sensitive Applications in Industrial Automation

Sollfrank, Michael ; Loch, Frieder ; Denteneer, Steef ; Vogel-Heuser, Birgit

IEEE transactions on industrial informatics, 2021-05, Vol.17 (5), p.3566-3576

Piscataway: IEEE

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10
Freezer: A Specialized NVM Backup Controller for Intermittently Powered Systems
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Freezer: A Specialized NVM Backup Controller for Intermittently Powered Systems

Pala, Davide ; Miro-Panades, Ivan ; Sentieys, Olivier

IEEE transactions on computer-aided design of integrated circuits and systems, 2021-08, Vol.40 (8), p.1559-1572 [Periódico revisado por pares]

New York: IEEE

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