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In-situ sensors for product reliability monitoring
In-situ sensors for product reliability monitoring
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Ata de Congresso 		Adicionar ao Meu Espaço

In-situ sensors for product reliability monitoring

Mishra, Satchidananda ; Pecht, Michael ; Goodman, Douglas L

SPIE proceedings series, 2002, Vol.4755, p.10-19

Bellingham WA: SPIE

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2
Insertion losses in micromachined free-space optical cross-connects due to fiber misalignments
Insertion losses in micromachined free-space optical cross-connects due to fiber misalignments
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Insertion losses in micromachined free-space optical cross-connects due to fiber misalignments

Martinez, Sergio O ; Courtois, Bernard

SPIE proceedings series, 2001, Vol.4408, p.289-300

Bellingham WA: SPIE

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3
Self-testable CMOS thermopile-based infrared imager
Self-testable CMOS thermopile-based infrared imager
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Self-testable CMOS thermopile-based infrared imager

Charlot, Benoit ; Parrain, F ; Mir, Salvador ; Courtois, Bernard

SPIE proceedings series, 2001, Vol.4408, p.96-103

Bellingham WA: SPIE

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4
Environmental test bench for reliability studies: influence of the temperature on rf switches with metallic membranes
Environmental test bench for reliability studies: influence of the temperature on rf switches with metallic membranes
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Environmental test bench for reliability studies: influence of the temperature on rf switches with metallic membranes

Lafontan, Xavier ; Le Touze, Christophe ; Wenk, Beatrice ; Kolesnik, Inna ; Pressecq, Francis ; Perez, Guy ; Nicot, Jean-Marc ; Dardalhon, Muriel ; Rigo, Sebastien

SPIE proceedings series, 2002, Vol.4755, p.624-633

Bellingham WA: SPIE

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5
Development of a workstation for optical testing and modification of IMEMS on a wafer
Development of a workstation for optical testing and modification of IMEMS on a wafer
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Development of a workstation for optical testing and modification of IMEMS on a wafer

Hedley, John ; Harris, Alun J ; Burdess, James S ; McNie, Mark E

SPIE proceedings series, 2001, Vol.4408, p.402-408

Bellingham WA: SPIE

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6
CMOS-compatible micromachined tactile fingerprint sensor
CMOS-compatible micromachined tactile fingerprint sensor
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CMOS-compatible micromachined tactile fingerprint sensor

Parrain, F ; Charlot, Benoit ; Galy, Nicolas ; Courtois, Bernard

SPIE proceedings series, 2002, Vol.4755, p.568-575

Bellingham WA: SPIE

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7
Design and characterization of levitated suspended rf inductors
Design and characterization of levitated suspended rf inductors
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Design and characterization of levitated suspended rf inductors

Palan, Bohuslav ; Torki, Kholdoun ; Courtois, Bernard ; Husak, Miroslav

SPIE proceedings series, 2002, Vol.4755, p.97-104

Bellingham WA: SPIE

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8
Production of novel 3D microstructures using excimer laser mask projection techniques
Production of novel 3D microstructures using excimer laser mask projection techniques
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Production of novel 3D microstructures using excimer laser mask projection techniques

Rizvi, Nadeem H

SPIE proceedings series, 1999, Vol.3680, p.546-552

Bellingham WA: SPIE

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9
Integration of a network solver and a field solver for the mixed level thermal simulation of MEMS problems
Integration of a network solver and a field solver for the mixed level thermal simulation of MEMS problems
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Integration of a network solver and a field solver for the mixed level thermal simulation of MEMS problems

Rencz, Marta ; Szekely, Vladimir ; Poppe, Andras

SPIE proceedings series, 2002, Vol.4755, p.36-43

Bellingham WA: SPIE

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10
Thermally excited SiN beam resonant pressure sensor
Thermally excited SiN beam resonant pressure sensor
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Thermally excited SiN beam resonant pressure sensor

Chen, Deyong ; Cui, Dafu ; Yu, Zhongyao ; Wang, Li ; Cui, Zheng ; Xia, Shanhong

SPIE proceedings series, 2001, Vol.4408, p.548-554

Bellingham WA: SPIE

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