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Quantitative force measurements using frequency modulation atomic force microscopy—theoretical foundations
Quantitative force measurements using frequency modulation atomic force microscopy—theoretical foundations
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Quantitative force measurements using frequency modulation atomic force microscopy—theoretical foundations

Sader, John E ; Uchihashi, Takayuki ; Higgins, Michael J ; Farrell, Alan ; Nakayama, Yoshikazu ; Jarvis, Suzanne P

Nanotechnology, 2005-03, Vol.16 (3), p.S94-S101 [Periódico revisado por pares]

IOP Publishing

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Quantitative measurement of solvation shells using frequency modulated atomic force microscopy
Quantitative measurement of solvation shells using frequency modulated atomic force microscopy
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Quantitative measurement of solvation shells using frequency modulated atomic force microscopy

Uchihashi, T ; Higgins, M ; Nakayama, Y ; Sader, J E ; Jarvis, S P

Nanotechnology, 2005-03, Vol.16 (3), p.S49-S53 [Periódico revisado por pares]

IOP Publishing

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3
Material characterisation of nanowires with intrinsic stress
Material characterisation of nanowires with intrinsic stress
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Material characterisation of nanowires with intrinsic stress

Mills, S ; Sader, J E ; Boland, J J

Nanotechnology, 2017-09, Vol.28 (35), p.355706 [Periódico revisado por pares]

England: IOP Publishing

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4
Frequency modulation atomic force microscopy: a dynamic measurement technique for biological systems
Frequency modulation atomic force microscopy: a dynamic measurement technique for biological systems
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Frequency modulation atomic force microscopy: a dynamic measurement technique for biological systems

Higgins, Michael J ; Riener, Christian K ; Uchihashi, Takayuki ; Sader, John E ; McKendry, Rachel ; Jarvis, Suzanne P

Nanotechnology, 2005-03, Vol.16 (3), p.S85-S89 [Periódico revisado por pares]

IOP Publishing

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5
Magnetic films on nanoperforated templates: a route towards percolated perpendicular media
Magnetic films on nanoperforated templates: a route towards percolated perpendicular media
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Magnetic films on nanoperforated templates: a route towards percolated perpendicular media

Schulze, C ; Faustini, M ; Lee, J ; Schletter, H ; Lutz, M U ; Krone, P ; Gass, M ; Sader, K ; Bleloch, A L ; Hietschold, M ; Fuger, M ; Suess, D ; Fidler, J ; Wolff, U ; Neu, V ; Grosso, D ; Makarov, D ; Albrecht, M

Nanotechnology, 2010-12, Vol.21 (49), p.495701-495701 [Periódico revisado por pares]

England: IOP Publishing

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6
Frequency dependence of viscous and viscoelastic dissipation in coated micro-cantilevers from noise measurement
Frequency dependence of viscous and viscoelastic dissipation in coated micro-cantilevers from noise measurement
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Frequency dependence of viscous and viscoelastic dissipation in coated micro-cantilevers from noise measurement

Paolino, P ; Bellon, L

Nanotechnology, 2009-10, Vol.20 (40), p.405705-405705 [Periódico revisado por pares]

England: IOP Publishing

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7
Practical implementation of dynamic methods for measuring atomic force microscope cantilever spring constants
Practical implementation of dynamic methods for measuring atomic force microscope cantilever spring constants
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Practical implementation of dynamic methods for measuring atomic force microscope cantilever spring constants

Cook, S M ; Schäffer, T E ; Chynoweth, K M ; Wigton, M ; Simmonds, R W ; Lang, K M

Nanotechnology, 2006-05, Vol.17 (9), p.2135-2145 [Periódico revisado por pares]

IOP Publishing

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8
Calibration of higher eigenmode spring constants of atomic force microscope cantilevers
Calibration of higher eigenmode spring constants of atomic force microscope cantilevers
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Calibration of higher eigenmode spring constants of atomic force microscope cantilevers

Lozano, Jose R ; Kiracofe, Daniel ; Melcher, John ; Garcia, Ricardo ; Raman, Arvind

Nanotechnology, 2010-11, Vol.21 (46), p.465502-465502 [Periódico revisado por pares]

England: IOP Publishing

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9
Finite optical spot size and position corrections in thermal spring constant calibration
Finite optical spot size and position corrections in thermal spring constant calibration
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Finite optical spot size and position corrections in thermal spring constant calibration

Proksch, R ; Schäffer, T E ; Cleveland, J P ; Callahan, R C ; Viani, M B

Nanotechnology, 2004-09, Vol.15 (9), p.1344-1350 [Periódico revisado por pares]

IOP Publishing

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10
Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methods
Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methods
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Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methods

Lévy, R ; Maaloum, M

Nanotechnology, 2002-02, Vol.13 (1), p.33-37 [Periódico revisado por pares]

Bristol: IOP Publishing

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