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Spectroscopic study using FTIR, Raman, XPS and NEXAFS of carbon nitride thin films deposited by RF magnetron sputtering
Spectroscopic study using FTIR, Raman, XPS and NEXAFS of carbon nitride thin films deposited by RF magnetron sputtering
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Spectroscopic study using FTIR, Raman, XPS and NEXAFS of carbon nitride thin films deposited by RF magnetron sputtering

Bouchet-Fabre, B. ; Marino, E. ; Lazar, G. ; Zellama, K. ; Clin, M. ; Ballutaud, D. ; Abel, F. ; Godet, C.

Thin solid films, 2005-06, Vol.482 (1), p.167-171 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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Chemical bonding modifications of tetrahedral amorphous carbon and nitrogenated tetrahedral amorphous carbon films induced by rapid thermal annealing
Chemical bonding modifications of tetrahedral amorphous carbon and nitrogenated tetrahedral amorphous carbon films induced by rapid thermal annealing
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Chemical bonding modifications of tetrahedral amorphous carbon and nitrogenated tetrahedral amorphous carbon films induced by rapid thermal annealing

McCann, R. ; Roy, S.S. ; Papakonstantinou, P. ; Bain, M.F. ; Gamble, H.S. ; McLaughlin, J.A.

Thin solid films, 2005-06, Vol.482 (1), p.34-40 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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