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1
Corrections to “Research on Decoding Algorithm of Split-Type Magnetic Encoder”
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Corrections to “Research on Decoding Algorithm of Split-Type Magnetic Encoder”

Kang, Jian ; Zhao, Yitao ; Li, Rongning ; Liu, Wei ; Hao, Shuanghui

IEEE transactions on instrumentation and measurement, 2024, Vol.73, p.1-1 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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2
Congratulations to Lydia Kavraki, Recipient of the 2023 IEEE Frances E. Allen Medal: Kavraki Invented Algorithms That Improve the Efficiency and Capabilities of Robots, Enable Scientists to Simulate the Interactions of Proteins, and Reveal How to Make Search Efficient for Problems Arising in the Physical World [Society News]
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Congratulations to Lydia Kavraki, Recipient of the 2023 IEEE Frances E. Allen Medal: Kavraki Invented Algorithms That Improve the Efficiency and Capabilities of Robots, Enable Scientists to Simulate the Interactions of Proteins, and Reveal How to Make Search Efficient for Problems Arising in the Physical World [Society News]

IEEE robotics & automation magazine, 2023-06, Vol.30 (2), p.131-132 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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3
Learning to Optimize: Training Deep Neural Networks for Interference Management
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Learning to Optimize: Training Deep Neural Networks for Interference Management

Sun, Haoran ; Chen, Xiangyi ; Shi, Qingjiang ; Hong, Mingyi ; Fu, Xiao ; Sidiropoulos, Nicholas D.

IEEE transactions on signal processing, 2018-10, Vol.66 (20), p.5438-5453 [Periódico revisado por pares]

New York: IEEE

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4
Transfer Learning-Based Dynamic Multiobjective Optimization Algorithms
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Transfer Learning-Based Dynamic Multiobjective Optimization Algorithms

Jiang, Min ; Huang, Zhongqiang ; Qiu, Liming ; Huang, Wenzhen ; Yen, Gary G.

IEEE transactions on evolutionary computation, 2018-08, Vol.22 (4), p.501-514 [Periódico revisado por pares]

New York: IEEE

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5
A Multi-Facet Survey on Memetic Computation
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A Multi-Facet Survey on Memetic Computation

Chen, Xianshun ; Ong, Yew-Soon ; Lim, Meng-Hiot ; Tan, Kay Chen

IEEE transactions on evolutionary computation, 2011-10, Vol.15 (5), p.591-607 [Periódico revisado por pares]

New York: IEEE

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6
Dendritic Neuron Model With Effective Learning Algorithms for Classification, Approximation, and Prediction
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Dendritic Neuron Model With Effective Learning Algorithms for Classification, Approximation, and Prediction

Gao, Shangce ; Zhou, Mengchu ; Wang, Yirui ; Cheng, Jiujun ; Yachi, Hanaki ; Wang, Jiahai

IEEE transaction on neural networks and learning systems, 2019-02, Vol.30 (2), p.601-614

United States: IEEE

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7
Fitness Dependent Optimizer: Inspired by the Bee Swarming Reproductive Process
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Fitness Dependent Optimizer: Inspired by the Bee Swarming Reproductive Process

Abdullah, Jaza Mahmood ; Ahmed, Tarik

IEEE access, 2019, Vol.7, p.43473-43486 [Periódico revisado por pares]

Piscataway: IEEE

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8
[Formula Omitted]-Laplacian Regularized Sparse Coding for Human Activity Recognition
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[Formula Omitted]-Laplacian Regularized Sparse Coding for Human Activity Recognition

Liu, Weifeng ; Zheng-Jun Zha ; Wang, Yanjiang ; Lu, Ke ; Tao, Dacheng

IEEE transactions on industrial electronics (1982), 2016-08, Vol.63 (8), p.5120 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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9
A Modified [Formula Omitted]- [Formula Omitted] Algorithm for HS-SAR Small-Aperture Data Imaging
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A Modified [Formula Omitted]- [Formula Omitted] Algorithm for HS-SAR Small-Aperture Data Imaging

Liang, Yi ; Yuanyuan Huai ; Ding, Jinshan ; Wang, Hongxian ; Xing, Mengdao

IEEE transactions on geoscience and remote sensing, 2016-06, Vol.54 (6), p.3710 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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10
Top Favorite Probabilistic Products Queries
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Top Favorite Probabilistic Products Queries

Zhou, Xu ; Li, Kenli ; Xiao, Guoqing ; Zhou, Yantao ; Li, Keqin

IEEE transactions on knowledge and data engineering, 2016-10, Vol.28 (10), p.2808-2821 [Periódico revisado por pares]

New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)

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