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Material Type: Artigo
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0.00035 mm2 on-chip leakage sensing unit for various devices in 10 nm FinFET processOh, G.-G ; Lee, Y.-W ; Lee, BElectronics letters, 2018-02, Vol.54 (4), p.213-215 [Periódico revisado por pares]The Institution of Engineering and TechnologyTexto completo disponível |
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Material Type: Livro
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1177 B.C.: The Year Civilization CollapsedEric H. Cline Eric H. ClinePrinceton University Press 2014Acesso online. A biblioteca também possui exemplares impressos. |
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Material Type: Livro
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4 |
Material Type: Livro
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14th Symposium on Computer Architecture and High Performance Computing, 2002. ProceedingsIEEE 2002Acesso online |
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Material Type: Livro
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6 |
Material Type: Livro
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The 16th CSI International Symposium on Computer Architecture and Digital Systems (CADS 2012)IEEE 2012Acesso online |
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7 |
Material Type: Livro
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16th International Conference on Parallel Architecture and Compilation Techniques (PACT 2007)IEEE 2007Acesso online |
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8 |
Material Type: Livro
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9 |
Material Type: Livro
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10 |
Material Type: Livro
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