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1
Automatic Software Repair: A Survey
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Automatic Software Repair: A Survey

Gazzola, Luca ; Micucci, Daniela ; Mariani, Leonardo

IEEE transactions on software engineering, 2019-01, Vol.45 (1), p.34-67 [Periódico revisado por pares]

New York: IEEE

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2
The Oracle Problem in Software Testing: A Survey
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The Oracle Problem in Software Testing: A Survey

Barr, Earl T. ; Harman, Mark ; McMinn, Phil ; Shahbaz, Muzammil ; Shin Yoo

IEEE transactions on software engineering, 2015-05, Vol.41 (5), p.507-525 [Periódico revisado por pares]

New York: IEEE

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3
A Survey of App Store Analysis for Software Engineering
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A Survey of App Store Analysis for Software Engineering

Martin, William ; Sarro, Federica ; Yue Jia ; Yuanyuan Zhang ; Harman, Mark

IEEE transactions on software engineering, 2017-09, Vol.43 (9), p.817-847 [Periódico revisado por pares]

New York: IEEE

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4
Comparing Methods for Large-Scale Agile Software Development: A Systematic Literature Review
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Comparing Methods for Large-Scale Agile Software Development: A Systematic Literature Review

Edison, Henry ; Wang, Xiaofeng ; Conboy, Kieran

IEEE transactions on software engineering, 2022-08, Vol.48 (8), p.2709-2731 [Periódico revisado por pares]

New York: IEEE

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5
Overcoming the Equivalent Mutant Problem: A Systematic Literature Review and a Comparative Experiment of Second Order Mutation
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Overcoming the Equivalent Mutant Problem: A Systematic Literature Review and a Comparative Experiment of Second Order Mutation

Madeyski, Lech ; Orzeszyna, Wojciech ; Torkar, Richard ; Jozala, Mariusz

IEEE transactions on software engineering, 2014-01, Vol.40 (1), p.23-42 [Periódico revisado por pares]

New York: IEEE

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6
Challenges and Common Solutions in Smart Contract Development
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Challenges and Common Solutions in Smart Contract Development

Kannengieser, Niclas ; Lins, Sebastian ; Sander, Christian ; Winter, Klaus ; Frey, Hellmuth ; Sunyaev, Ali

IEEE transactions on software engineering, 2022-11, Vol.48 (11), p.4291-4318 [Periódico revisado por pares]

New York: IEEE

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7
Measuring the Impact of Code Dependencies on Software Architecture Recovery Techniques
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Measuring the Impact of Code Dependencies on Software Architecture Recovery Techniques

Lutellier, Thibaud ; Chollak, Devin ; Garcia, Joshua ; Tan, Lin ; Rayside, Derek ; Medvidovic, Nenad ; Kroeger, Robert

IEEE transactions on software engineering, 2018-02, Vol.44 (2), p.159-181 [Periódico revisado por pares]

New York: IEEE

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8
Detecting Trivial Mutant Equivalences via Compiler Optimisations
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Detecting Trivial Mutant Equivalences via Compiler Optimisations

Kintis, Marinos ; Papadakis, Mike ; Yue Jia ; Malevris, Nicos ; Le Traon, Yves ; Harman, Mark

IEEE transactions on software engineering, 2018-04, Vol.44 (4), p.308-333 [Periódico revisado por pares]

New York: IEEE

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9
Within-Project Defect Prediction of Infrastructure-as-Code Using Product and Process Metrics
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Within-Project Defect Prediction of Infrastructure-as-Code Using Product and Process Metrics

Dallapalma, Stefano ; Di Nucci, Dario ; Palomba, Fabio ; Tamburri, Damian Andrew

IEEE transactions on software engineering, 2022-06, Vol.48 (6), p.1-1 [Periódico revisado por pares]

New York: IEEE

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10
MultiPL-E: A Scalable and Polyglot Approach to Benchmarking Neural Code Generation
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MultiPL-E: A Scalable and Polyglot Approach to Benchmarking Neural Code Generation

Cassano, Federico ; Gouwar, John ; Nguyen, Daniel ; Nguyen, Sydney ; Phipps-Costin, Luna ; Pinckney, Donald ; Yee, Ming-Ho ; Zi, Yangtian ; Anderson, Carolyn Jane ; Feldman, Molly Q ; Guha, Arjun ; Greenberg, Michael ; Jangda, Abhinav

IEEE transactions on software engineering, 2023-07, Vol.49 (7), p.3675-3691 [Periódico revisado por pares]

New York: IEEE

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