skip to main content
Primo Advanced Search
Primo Advanced Search Query Term
Primo Advanced Search Query Term
Primo Advanced Search Query Term
Primo Advanced Search prefilters
Refinado por: Nome da Publicação: Journal Of Luminescence remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Study of silicon rich oxide light emitter capacitors using textured substrates by metal assisted chemical etching
Material Type:
Artigo
Adicionar ao Meu Espaço

Study of silicon rich oxide light emitter capacitors using textured substrates by metal assisted chemical etching

Pérez-Díaz, O. ; González-Fernández, A.A. ; Aceves-Mijares, M.

Journal of luminescence, 2022-10, Vol.250, p.119054, Article 119054 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

2
Impact of the gate fabrication process of light emitting capacitors based on silicon-rich oxide: Low voltage electroluminescence
Material Type:
Artigo
Adicionar ao Meu Espaço

Impact of the gate fabrication process of light emitting capacitors based on silicon-rich oxide: Low voltage electroluminescence

Avilés-Bravo, J.J. ; Palacios-Huerta, L. ; Aceves-Mijares, M. ; González-Flores, K.E. ; Morales-Morales, F. ; Morales-Sánchez, A.

Journal of luminescence, 2021-12, Vol.240, p.118470, Article 118470 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

3
Comparison of light emitting capacitors with textured and polished silicon substrates towards the understanding of the emission mechanisms
Material Type:
Artigo
Adicionar ao Meu Espaço

Comparison of light emitting capacitors with textured and polished silicon substrates towards the understanding of the emission mechanisms

Alarcón-Salazar, J. ; Vásquez-Agustín, M.A. ; Quiroga-González, E. ; Zaldívar-Huerta, I.E. ; Aceves-Mijares, M.

Journal of luminescence, 2018-11, Vol.203, p.646-654 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

4
Influence of the gate and dielectric thickness on the electro-optical performance of SRO-based LECs: Resistive switching, IR and deep UV emission
Material Type:
Artigo
Adicionar ao Meu Espaço

Influence of the gate and dielectric thickness on the electro-optical performance of SRO-based LECs: Resistive switching, IR and deep UV emission

Cabañas-Tay, S.A. ; Palacios-Huerta, L. ; Aceves-Mijares, M. ; Alvarez-Quintana, J. ; Pérez-García, S.A. ; Domínguez-Horna, C. ; Morales-Sánchez, A.

Journal of luminescence, 2017-12, Vol.192, p.919-924 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

5
Photoluminescence comparison of SRO-LPCVD films deposited on quartz, polysilicon and silicon substrates
Material Type:
Artigo
Adicionar ao Meu Espaço

Photoluminescence comparison of SRO-LPCVD films deposited on quartz, polysilicon and silicon substrates

Martínez-Hernández, H.P. ; Luna López, J.A. ; Aceves Mijares, M. ; Monfil Leyva, K. ; García Salgado, G. ; Hernández-de-la-Luz, J.A.D. ; Luna Flores, A. ; Morales-Caporal, R. ; Ramírez Amador, R. ; Hernández Simón, Z.J.

Journal of luminescence, 2019-12, Vol.216, p.116709, Article 116709 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

6
Study of narrow and intense UV electroluminescence from ITO/SRO/Si-p and ITO/SRN/SRO/Si-p based light emitting capacitors
Material Type:
Artigo
Adicionar ao Meu Espaço

Study of narrow and intense UV electroluminescence from ITO/SRO/Si-p and ITO/SRN/SRO/Si-p based light emitting capacitors

Cabañas-Tay, S.A. ; Palacios-Huerta, L. ; Aceves-Mijares, M. ; Coyopol, A. ; Morales-Morales, F. ; Pérez-García, S.A. ; Licea-Jiménez, L. ; Domínguez-Horna, C. ; Monfil-Leyva, K. ; Morales-Sánchez, A.

Journal of luminescence, 2017-03, Vol.183, p.334-340 [Periódico revisado por pares]

Elsevier B.V

Texto completo disponível

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Data de Publicação 

De até
  1. Antes de2017  (1)
  2. 2017Até2017  (2)
  3. 2018Até2018  (1)
  4. 2019Até2021  (2)
  5. Após 2021  (1)
  6. Mais opções open sub menu

Buscando em bases de dados remotas. Favor aguardar.