skip to main content
Idioma:
Mostrar Somente
Refinado por: assunto: Engineering, Electrical & Electronic remover assunto: Technology remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Method of HWIL simulation for the dual-mode optical sensor
Method of HWIL simulation for the dual-mode optical sensor
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Method of HWIL simulation for the dual-mode optical sensor

Yonezawa, Toru ; Kinoshita, Toshiya ; Ohtake, Ryuji ; Nakajima, Hisayuki ; Miyauchi, Hiroshi

SPIE proceedings series, 1999, Vol.3697, p.120-127

Bellingham WA: SPIE

Texto completo disponível

Citações Citado por
2
Preflight and In-Flight Calibration of the Spectral Profiler on Board SELENE (Kaguya)
Preflight and In-Flight Calibration of the Spectral Profiler on Board SELENE (Kaguya)
Material Type:
Artigo 		Adicionar ao Meu Espaço

Preflight and In-Flight Calibration of the Spectral Profiler on Board SELENE (Kaguya)

Yamamoto, S. ; Matsunaga, T. ; Ogawa, Y. ; Nakamura, R. ; Yokota, Y. ; Ohtake, M. ; Haruyama, J. ; Morota, T. ; Honda, C. ; Hiroi, T. ; Kodama, S.

IEEE transactions on geoscience and remote sensing, 2011-11, Vol.49 (11), p.4660-4676 [Periódico revisado por pares]

New York, NY: IEEE

Texto completo disponível

Citações Citado por
3
Three-Dimensional Integration of Fully Depleted Silicon-on-Insulator Transistor Substrates for CMOS Image Sensors Using Au/SiO2 Hybrid Bonding and XeF2 Etching
Three-Dimensional Integration of Fully Depleted Silicon-on-Insulator Transistor Substrates for CMOS Image Sensors Using Au/SiO2 Hybrid Bonding and XeF2 Etching
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Three-Dimensional Integration of Fully Depleted Silicon-on-Insulator Transistor Substrates for CMOS Image Sensors Using Au/SiO2 Hybrid Bonding and XeF2 Etching

Hagiwara, Kei ; Goto, Masahide ; Iguchi, Yoshinori ; Ohtake, Hiroshi ; Saraya, Takuya ; Toshiyoshi, Hiroshi ; Higurashi, Eiji ; Hiramoto, Toshiro

ECS transactions, 2014, Vol.64 (5), p.391-396

The Electrochemical Society, Inc

Texto completo disponível

Citações Citado por
4
Demonstration of Vehicle to Vehicle Communications over TV White Space
Demonstration of Vehicle to Vehicle Communications over TV White Space
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Demonstration of Vehicle to Vehicle Communications over TV White Space

Altintas, O. ; Nishibori, M. ; Oshida, T. ; Yoshimura, C. ; Fujii, Y. ; Nishida, K. ; Ihara, Y. ; Saito, M. ; Tsukamoto, K. ; Tsuru, M. ; Oie, Y. ; Vuyyuru, R. ; Al Abbasi, Abdulrahman ; Ohtake, M. ; Ohta, Mai ; Fujii, T. ; Si Chen ; Pagadarai, S. ; Wyglinski, A. M.

2011 IEEE Vehicular Technology Conference (VTC Fall), 2011, p.1-3

IEEE

Texto completo disponível

Citações Citado por
5
First cool-down performance of the LHD
First cool-down performance of the LHD
Material Type:
Artigo 		Adicionar ao Meu Espaço

First cool-down performance of the LHD

Mito, T. ; Maekawa, R. ; Yamada, S. ; Nishimura, A. ; Takahata, K. ; Iwamoto, A. ; Imagawa, S. ; Watanabe, K. ; Yanagi, N. ; Tamura, H. ; Baba, T. ; Moriuchi, S. ; Ohu, K. ; Sekiguchi, H. ; Ohtake, I. ; Satow, T. ; Satoh, S. ; Motojima, O.

IEEE transactions on applied superconductivity, 1999-06, Vol.9 (2), p.640-643 [Periódico revisado por pares]

New York, NY: IEEE

Texto completo disponível

Citações Citado por
6
Completion and trial operation of the superconducting magnets for the Large Helical Device
Completion and trial operation of the superconducting magnets for the Large Helical Device
Material Type:
Artigo 		Adicionar ao Meu Espaço

Completion and trial operation of the superconducting magnets for the Large Helical Device

Satow, T. ; Yanagi, N. ; Imagawa, S. ; Tamura, H. ; Takahata, K. ; Mito, T. ; Chikaraishi, H. ; Yamada, S. ; Nishimura, A. ; Maekawa, R. ; Iwamoto, A. ; Inoue, N. ; Nakamura, Y. ; Watanabe, K. ; Yamada, H. ; Komori, A. ; Ohtake, I. ; Iima, M. ; Satoh, S. ; Motojima, O.

IEEE transactions on applied superconductivity, 1999-06, Vol.9 (2), p.1008-1011 [Periódico revisado por pares]

New York, NY: IEEE

Texto completo disponível

Citações Citado por
7
A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits
A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits

Iwagaki, T. ; Ohtake, S. ; Fujiwara, H.

2006 IFIP International Conference on Very Large Scale Integration, 2006, p.308-313

IEEE

Texto completo disponível

Citações Citado por
8
Origin of intensity errors in THz-TDS measurements: Relation between beam deflection of the fs-laser and the THz-intensity fluctuations
Origin of intensity errors in THz-TDS measurements: Relation between beam deflection of the fs-laser and the THz-intensity fluctuations
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

Origin of intensity errors in THz-TDS measurements: Relation between beam deflection of the fs-laser and the THz-intensity fluctuations

Takeda, M. ; Tripathi, S. R. ; Aoki, M. ; Hirano, K. ; Ohtake, H. ; Hirosumi, T. ; Hiromoto, N.

2011 International Conference on Infrared, Millimeter, and Terahertz Waves, 2011, p.1-2

IEEE

Texto completo disponível

Citações Citado por

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Mostrar Somente

  1. Revistas revisadas por pares (3)

Refinar Meus Resultados

Tipo de Recurso 

  1. Anais de Congresso  (5)
  2. Artigos  (3)
  3. Mais opções open sub menu

Data de Publicação 

De até
Refinar

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.