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1
Early Life Cycle Software Defect Prediction. Why? How?
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Early Life Cycle Software Defect Prediction. Why? How?

N.C., Shrikanth ; Majumder, Suvodeep ; Menzies, Tim

2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.448-459

IEEE

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Studying the Usage of Text-To-Text Transfer Transformer to Support Code-Related Tasks
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Studying the Usage of Text-To-Text Transfer Transformer to Support Code-Related Tasks

Mastropaolo, Antonio ; Scalabrino, Simone ; Cooper, Nathan ; Nader Palacio, David ; Poshyvanyk, Denys ; Oliveto, Rocco ; Bavota, Gabriele

2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.336-347

IEEE

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An exploratory study of the pull-based software development model
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An exploratory study of the pull-based software development model

Gousios, Georgios ; Pinzger, Martin ; Deursen, Arie van

Proceedings of the 36th International Conference on Software Engineering, 2014, p.345-355

New York, NY, USA: ACM

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Predicting defects using network analysis on dependency graphs
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Predicting defects using network analysis on dependency graphs

Zimmermann, Thomas ; Nagappan, Nachiappan

2008 ACM/IEEE 30th International Conference on Software Engineering, 2008, Vol.2008 (24), p.531-540

New York, NY, USA: ACM

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5
Mining metrics to predict component failures
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Mining metrics to predict component failures

Nagappan, Nachiappan ; Ball, Thomas ; Zeller, Andreas

International Conference on Software Engineering: Proceeding of the 28th international conference on Software engineering; 20-28 May 2006, 2006, p.452-461

New York, NY, USA: ACM

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Guidelines towards better participation of older adults in software development processes using a new SPIRAL method and participatory approach
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Guidelines towards better participation of older adults in software development processes using a new SPIRAL method and participatory approach

Kopeć, Wiesław ; Nielek, Radoslaw ; Wierzbicki, Adam

Proceedings of the 11th International Workshop on Cooperative and Human Aspects of Software Engineering, 2018, p.49-56

New York, NY, USA: ACM

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Patterns in property specifications for finite-state verification
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Patterns in property specifications for finite-state verification

Dwyer, Matthew B. ; Avrunin, George S. ; Corbett, James C.

Proceedings of the 1999 International Conference on Software Engineering (IEEE Cat. No.99CB37002), 1999, p.411-420

New York, NY, USA: ACM

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8
Testing autonomous cars for feature interaction failures using many-objective search
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Testing autonomous cars for feature interaction failures using many-objective search

Abdessalem, Raja Ben ; Panichella, Annibale ; Nejati, Shiva ; Briand, Lionel C. ; Stifter, Thomas

2018 33rd IEEE/ACM International Conference on Automated Software Engineering (ASE), 2018, p.143-154

New York, NY, USA: ACM

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9
Static detection of cross-site scripting vulnerabilities
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Static detection of cross-site scripting vulnerabilities

Wassermann, Gary ; Su, Zhendong

2008 ACM/IEEE 30th International Conference on Software Engineering, 2008, Vol.2008 (24), p.171-180

New York, NY, USA: ACM

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10
Change Distilling:Tree Differencing for Fine-Grained Source Code Change Extraction
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Artigo
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Change Distilling:Tree Differencing for Fine-Grained Source Code Change Extraction

Fluri, Beat ; Wursch, Michael ; PInzger, Martin ; Gall, Harald

IEEE transactions on software engineering, 2007-11, Vol.33 (11), p.725-743 [Periódico revisado por pares]

New York: IEEE

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