Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Noise its measurement, analysis, rating, and controlJ. S. Anderson 1941- (John Stuart) B Bratos-AndersonAldershot, England Avebury Technical Brookfield, Vt. Ashgate Pub. Co. 1993Localização: EPBC - Esc. Politécnica-Bib Central (534.83 An23n )(Acessar) |
2 |
Material Type: Livro
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Acoustic Array Systems: Theory, Implementation, and ApplicationBai, Mingsian R ; Ih, Jeong-Guon ; Benesty, JacobNewark: Wiley-IEEE Press 2013Texto completo disponível |
3 |
Material Type: Artigo
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Recommendations for Improved Assessment of Noise Impacts on WildlifePater, Larry L ; Grubb, Teryl G ; Delaney, David KThe Journal of wildlife management, 2009-07, Vol.73 (5), p.788-795 [Periódico revisado por pares]Oxford, UK: The Wildlife SocietyTexto completo disponível |
4 |
Material Type: Artigo
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Information coverage for wireless sensor networksBang Wang ; Wei Wang ; Srinivasan, V. ; Kee Chaing ChuaIEEE communications letters, 2005-11, Vol.9 (11), p.967-969 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
5 |
Material Type: Artigo
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1/f noise sourcesHooge, F.N.IEEE transactions on electron devices, 1994-11, Vol.41 (11), p.1926-1935 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
6 |
Material Type: Artigo
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Comments on "Variable Explicit Regularization in Affine Projection Algorithm: Robustness Issues and Optimal ChoiceMuralidhar, Karthik ; Kwok Hung Li ; George, SapnaIEEE transactions on signal processing, 2010-07, Vol.58 (7), p.3952-3953 [Periódico revisado por pares]New York: IEEETexto completo disponível |
7 |
Material Type: Ata de Congresso
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The first observation of shot noise characteristics in 10-nm scale MOSFETsJeon, J. ; Lee, J. ; Kim, J. ; Park, C.H. ; Lee, H. ; Oh, H. ; Kang, H.-K. ; Park, B.-G. ; Shin, H.2009 Symposium on VLSI Technology, 2009, p.48-49IEEETexto completo disponível |
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Material Type: Ata de Congresso
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The Influence of Operating Systems on the Performance of Collective Operations at Extreme ScaleBeckman, P. ; Iskra, K. ; Yoshii, K. ; Coghlan, S.2006 IEEE International Conference on Cluster Computing, 2006, p.1-12IEEETexto completo disponível |
9 |
Material Type: Artigo
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On the Electrical Origin of Flicker Noise in Vacuum DevicesIzpura, J.I.IEEE transactions on instrumentation and measurement, 2009-10, Vol.58 (10), p.3592-3601 [Periódico revisado por pares]New York: IEEETexto completo disponível |
10 |
Material Type: Artigo
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Room Acoustics Measurement System Design Using Simulation and Experimental StudiesNecsulescu, D. ; Wei Zhang ; Weiss, W. ; Sasiadek, J.IEEE transactions on instrumentation and measurement, 2009-01, Vol.58 (1), p.167-172 [Periódico revisado por pares]New York: IEEETexto completo disponível |