skip to main content
Idioma:
Mostrar Somente
Refinado por: assunto: Engineering, Electrical & Electronic remover assunto: Physical Sciences remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Distributed Partial Discharge Locating and Detecting Scheme Based on Optical Fiber Rayleigh Backscattering Light Interference
Distributed Partial Discharge Locating and Detecting Scheme Based on Optical Fiber Rayleigh Backscattering Light Interference
Material Type:
Artigo 		Adicionar ao Meu Espaço

Distributed Partial Discharge Locating and Detecting Scheme Based on Optical Fiber Rayleigh Backscattering Light Interference

Zhou, Zhengxian ; Liu, Hao ; Zhang, Dawei ; Han, Yashuai ; Yang, Xinyan ; Zheng, Xianfeng ; Qu, Jun

Sensors (Basel, Switzerland), 2023-02, Vol.23 (4), p.1828 [Periódico revisado por pares]

Switzerland: MDPI AG

Texto completo disponível

Citações Citado por
2
All-optical NOT and XOR logic gates using photonic crystal nano-resonator and based on an interference effect
All-optical NOT and XOR logic gates using photonic crystal nano-resonator and based on an interference effect
Material Type:
Artigo 		Adicionar ao Meu Espaço

All-optical NOT and XOR logic gates using photonic crystal nano-resonator and based on an interference effect

Mohebzadeh-Bahabady, Ahmad ; Olyaee, Saeed

IET optoelectronics, 2018-08, Vol.12 (4), p.191-195 [Periódico revisado por pares]

The Institution of Engineering and Technology

Texto completo disponível

Citações Citado por
3
A Novel White Light Interference Based AFM Head
A Novel White Light Interference Based AFM Head
Material Type:
Artigo 		Adicionar ao Meu Espaço

A Novel White Light Interference Based AFM Head

Yang, Wenjun ; Yang, Xiaojun ; Lu, Wenlong ; Yu, Nengguo ; Chen, Liangzhou ; Zhou, Liping ; Chang, Suping

Journal of lightwave technology, 2017-08, Vol.35 (16), p.3604-3610 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
4
Experimental Study of White Light Interferometry in Mach-Zehnder Interferometers Based on Standard Single Mode Fiber
Experimental Study of White Light Interferometry in Mach-Zehnder Interferometers Based on Standard Single Mode Fiber
Material Type:
Artigo 		Adicionar ao Meu Espaço

Experimental Study of White Light Interferometry in Mach-Zehnder Interferometers Based on Standard Single Mode Fiber

Cano-Perez, José Luis ; Gutiérrez-Gutiérrez, Jaime ; Perezcampos-Mayoral, Christian ; Pérez-Campos, Eduardo L ; Pina-Canseco, María Del Socorro ; Tepech-Carrillo, Lorenzo ; Vargas-Treviño, Marciano ; Guerra-Hernández, Erick Israel ; Martínez-Helmes, Abraham ; Estudillo-Ayala, Julián Moisés ; Sierra-Hernández, Juan Manuel ; Rojas-Laguna, Roberto

Sensors (Basel, Switzerland), 2024-05, Vol.24 (10), p.3026 [Periódico revisado por pares]

Switzerland: MDPI AG

Texto completo disponível

Citações Citado por
5
Silicon-Cantilever-Enhanced Single-Fiber Photoacoustic Acetylene Gas Sensor
Silicon-Cantilever-Enhanced Single-Fiber Photoacoustic Acetylene Gas Sensor
Material Type:
Artigo 		Adicionar ao Meu Espaço

Silicon-Cantilever-Enhanced Single-Fiber Photoacoustic Acetylene Gas Sensor

Zhang, Zhengyuan ; Fan, Xinhong ; Xu, Yufu ; Wang, Yongqi ; Tang, Yiyao ; Zhao, Rui ; Li, Chenxi ; Wang, Heng ; Chen, Ke

Sensors (Basel, Switzerland), 2023-09, Vol.23 (17), p.7644 [Periódico revisado por pares]

Basel: MDPI AG

Texto completo disponível

Citações Citado por
6
Study on Measurement Error Reduction Using the Internal Interference Light Reduction Structure of a Time-of-Flight Sensor
Study on Measurement Error Reduction Using the Internal Interference Light Reduction Structure of a Time-of-Flight Sensor
Material Type:
Artigo 		Adicionar ao Meu Espaço

Study on Measurement Error Reduction Using the Internal Interference Light Reduction Structure of a Time-of-Flight Sensor

Lee, Byung-Chul ; Choi, Byeong-Chan ; Bang, Hyeon-Song ; Koh, Yong Nam ; Han, Kwan-Young

IEEE sensors journal, 2022-07, Vol.22 (13), p.12967-12975 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
7
Performance evaluation technique for screen‐to‐camera‐based optical camera communications
Performance evaluation technique for screen‐to‐camera‐based optical camera communications
Material Type:
Artigo 		Adicionar ao Meu Espaço

Performance evaluation technique for screen‐to‐camera‐based optical camera communications

Yokar, Vaigai Nayaki ; Le‐Minh, Hoa ; Ghassemlooy, Zabih ; Woo, Wai Lok

IET Optoelectronics, 2023-08, Vol.17 (4), p.184-193 [Periódico revisado por pares]

John Wiley & Sons, Inc

Texto completo disponível

Citações Citado por
8
Correlation between crystal warpage and swelling of 4H-SiC through implantation and annealing
Correlation between crystal warpage and swelling of 4H-SiC through implantation and annealing
Material Type:
Artigo 		Adicionar ao Meu Espaço

Correlation between crystal warpage and swelling of 4H-SiC through implantation and annealing

Ishiji, Kotaro ; Sato, Kiichi ; Fujii, Takashi ; Araki, Tsutomu ; Mouri, Shinichiro ; Sugie, Ryuichi

Semiconductor science and technology, 2020-10, Vol.35 (10), p.105008 [Periódico revisado por pares]

IOP Publishing

Texto completo disponível

Citações Citado por
9
Implementation of all‐optical Toffoli gate by 2D Si–air photonic crystal
Implementation of all‐optical Toffoli gate by 2D Si–air photonic crystal
Material Type:
Artigo 		Adicionar ao Meu Espaço

Implementation of all‐optical Toffoli gate by 2D Si–air photonic crystal

De, Paromita ; Ranwa, Sapana ; Mukhopadhyay, Sourangshu

IET Optoelectronics, 2021-06, Vol.15 (3), p.139-148 [Periódico revisado por pares]

John Wiley & Sons, Inc

Texto completo disponível

Citações Citado por
10
Two-Parameter Elliptical Fitting Method for Short-Cavity Fiber Fabry⁻Perot Sensor Interrogation
Two-Parameter Elliptical Fitting Method for Short-Cavity Fiber Fabry⁻Perot Sensor Interrogation
Material Type:
Artigo 		Adicionar ao Meu Espaço

Two-Parameter Elliptical Fitting Method for Short-Cavity Fiber Fabry⁻Perot Sensor Interrogation

Zhang, Xiongxing ; Wang, Wei ; Chen, Haibin ; Tang, Ying ; Ma, Zhibo ; Wang, Kening

Sensors (Basel, Switzerland), 2018-12, Vol.19 (1), p.36 [Periódico revisado por pares]

Switzerland: MDPI AG

Texto completo disponível

Citações Citado por

Personalize Seus Resultados

  1. Editar

Refine Search Results

Mostrar Somente

  1. Recursos Online (406)
  2. Revistas revisadas por pares (309)

Refinar Meus Resultados

Tipo de Recurso 

  1. Artigos  (371)
  2. Anais de Congresso  (94)
  3. Livros  (2)
  4. Book Chapters  (1)
  5. Mais opções open sub menu

Idioma 

  1. Japonês  (21)
  2. Russo  (5)
  3. Chinês  (3)
  4. Mais opções open sub menu

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.