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Material Type: Artigo
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A step-by-step guide to perform x-ray photoelectron spectroscopyGreczynski, Grzegorz ; Hultman, LarsJournal of applied physics, 2022-07, Vol.132 (1) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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AlScN: A III-V semiconductor based ferroelectricFichtner, Simon ; Wolff, Niklas ; Lofink, Fabian ; Kienle, Lorenz ; Wagner, BernhardJournal of applied physics, 2019-03, Vol.125 (11) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Physical chemistry of the TiN/Hf0.5Zr0.5O2 interfaceHamouda, W. ; Pancotti, A. ; Lubin, C. ; Tortech, L. ; Richter, C. ; Mikolajick, T. ; Schroeder, U. ; Barrett, N.Journal of applied physics, 2020-02, Vol.127 (6) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materialsJiang, Puqing ; Qian, Xin ; Yang, RongguiJournal of applied physics, 2018-10, Vol.124 (16) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Frontiers of magnetic force microscopyKazakova, O. ; Puttock, R. ; Barton, C. ; Corte-León, H. ; Jaafar, M. ; Neu, V. ; Asenjo, A.Journal of applied physics, 2019-02, Vol.125 (6) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Effects of deposition conditions on the ferroelectric properties of (Al1−xScx)N thin filmsYasuoka, Shinnosuke ; Shimizu, Takao ; Tateyama, Akinori ; Uehara, Masato ; Yamada, Hiroshi ; Akiyama, Morito ; Hiranaga, Yoshiomi ; Cho, Yasuo ; Funakubo, HiroshiJournal of applied physics, 2020-09, Vol.128 (11) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Tutorial: Reactive high power impulse magnetron sputtering (R-HiPIMS)Anders, AndréJournal of applied physics, 2017-05, Vol.121 (17) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Tutorial: Understanding residual stress in polycrystalline thin films through real-time measurements and physical modelsChason, Eric ; Guduru, Pradeep R.Journal of applied physics, 2016-05, Vol.119 (19) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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A light-stimulated synaptic transistor with synaptic plasticity and memory functions based on InGaZnOx–Al2O3 thin film structureLi, H. K. ; Chen, T. P. ; Liu, P. ; Hu, S. G. ; Liu, Y. ; Zhang, Q. ; Lee, P. S.Journal of applied physics, 2016-06, Vol.119 (24) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Hall measurements on low-mobility thin filmsWerner, FlorianJournal of applied physics, 2017-10, Vol.122 (13) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |