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Automated detection and classification of fundus diabetic retinopathy images using synergic deep learning modelShankar, K. ; Sait, Abdul Rahaman Wahab ; Gupta, Deepak ; Lakshmanaprabu, S.K. ; Khanna, Ashish ; Pandey, Hari MohanPattern recognition letters, 2020-05, Vol.133, p.210-216 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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Learning From Noisy Labels With Deep Neural Networks: A SurveySong, Hwanjun ; Kim, Minseok ; Park, Dongmin ; Shin, Yooju ; Lee, Jae-GilIEEE transaction on neural networks and learning systems, 2023-11, Vol.34 (11), p.8135-8153United States: IEEETexto completo disponível |
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Deep Residual Learning for Image Recognition: A SurveyShafiq, Muhammad ; Gu, ZhaoquanApplied sciences, 2022-09, Vol.12 (18), p.8972 [Periódico revisado por pares]Basel: MDPI AGTexto completo disponível |
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More Diverse Means Better: Multimodal Deep Learning Meets Remote-Sensing Imagery ClassificationHong, Danfeng ; Gao, Lianru ; Yokoya, Naoto ; Yao, Jing ; Chanussot, Jocelyn ; Du, Qian ; Zhang, BingIEEE transactions on geoscience and remote sensing, 2021-05, Vol.59 (5), p.4340-4354 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Brain Tumor/Mass Classification Framework Using Magnetic-Resonance-Imaging-Based Isolated and Developed Transfer Deep-Learning ModelAlanazi, Muhannad Faleh ; Ali, Muhammad Umair ; Hussain, Shaik Javeed ; Zafar, Amad ; Mohatram, Mohammed ; Irfan, Muhammad ; AlRuwaili, Raed ; Alruwaili, Mubarak ; Ali, Naif H ; Albarrak, Anas MohammadSensors (Basel, Switzerland), 2022-01, Vol.22 (1), p.372 [Periódico revisado por pares]Switzerland: MDPI AGTexto completo disponível |
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Material Type: Ata de Congresso
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Tensor feature hallucination for few-shot learningLazarou, Michalis ; Stathaki, Tania ; Avrithis, Yannis2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 2022, p.2050-2060IEEESem texto completo |
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Material Type: Ata de Congresso
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Dual Cross-Attention Learning for Fine-Grained Visual Categorization and Object Re-IdentificationZhu, Haowei ; Ke, Wenjing ; Li, Dong ; Liu, Ji ; Tian, Lu ; Shan, Yi2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2022, p.4682-4692IEEESem texto completo |
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Material Type: Artigo
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3-D Deep Learning Approach for Remote Sensing Image ClassificationBen Hamida, Amina ; Benoit, Alexandre ; Lambert, Patrick ; Ben Amar, ChokriIEEE transactions on geoscience and remote sensing, 2018-08, Vol.56 (8), p.4420-4434 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Intelligent Fault Diagnosis for Planetary Gearbox Using Time-Frequency Representation and Deep Reinforcement LearningWang, Hui ; Xu, Jiawen ; Sun, Chuang ; Yan, Ruqiang ; Chen, XuefengIEEE/ASME transactions on mechatronics, 2022-04, Vol.27 (2), p.985-998 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Customized VGG19 Architecture for Pneumonia Detection in Chest X-RaysDey, Nilanjan ; Zhang, Yu-Dong ; Rajinikanth, V. ; Pugalenthi, R. ; Raja, N. Sri MadhavaPattern recognition letters, 2021-03, Vol.143, p.67-74 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |