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Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials
Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials
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Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials

Taghavi, Najme S. ; Gant, Patricia ; Huang, Peng ; Niehues, Iris ; Schmidt, Robert ; Michaelis de Vasconcellos, Steffen ; Bratschitsch, Rudolf ; García-Hernández, Mar ; Frisenda, Riccardo ; Castellanos-Gomez, Andres

Nano research, 2019-07, Vol.12 (7), p.1691-1695 [Periódico revisado por pares]

Beijing: Tsinghua University Press

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2
Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2
Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2
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Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2

Niu, Yue ; Gonzalez-Abad, Sergio ; Frisenda, Riccardo ; Marauhn, Philipp ; Drüppel, Matthias ; Gant, Patricia ; Schmidt, Robert ; Taghavi, Najme ; Barcons, David ; Molina-Mendoza, Aday ; de Vasconcellos, Steffen ; Bratschitsch, Rudolf ; Perez De Lara, David ; Rohlfing, Michael ; Castellanos-Gomez, Andres

Nanomaterials (Basel, Switzerland), 2018-09, Vol.8 (9), p.725 [Periódico revisado por pares]

Basel: MDPI AG

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