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Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography
Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography
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Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography

Rastelli, Armando ; Stoffel, Mathieu ; Malachias, Angelo ; Merdzhanova, Tsvetelina ; Katsaros, Georgios ; Kern, Klaus ; Metzger, Till H ; Schmidt, Oliver G

Nano letters, 2008-05, Vol.8 (5), p.1404-1409 [Periódico revisado por pares]

Washington, DC: American Chemical Society

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Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques
Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques
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Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques

Carbone, D ; Biermanns, A ; Ziberi, B ; Frost, F ; Plantevin, O ; Pietsch, U ; Metzger, T H

Journal of physics. Condensed matter, 2009-06, Vol.21 (22), p.224007-224007 (23) [Periódico revisado por pares]

England: IOP Publishing

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3
Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
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Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Favre-Nicolin, V ; Mastropietro, F ; Eymery, J ; Camacho, D ; Niquet, Y M ; Borg, B M ; Messing, M E ; Wernersson, L-E ; Algra, R E ; Bakkers, E P A M ; Metzger, T H ; Harder, R ; Robinson, I K

New journal of physics, 2010-03, Vol.12 (3), p.035013 [Periódico revisado por pares]

IOP Publishing

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4
Direct determination of strain and composition profiles in SiGe islands by anomalous x-Ray diffraction at high momentum transfer
Direct determination of strain and composition profiles in SiGe islands by anomalous x-Ray diffraction at high momentum transfer
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Direct determination of strain and composition profiles in SiGe islands by anomalous x-Ray diffraction at high momentum transfer

Schülli, T U ; Stangl, J ; Zhong, Z ; Lechner, R T ; Sztucki, M ; Metzger, T H ; Bauer, G

Physical review letters, 2003-02, Vol.90 (6), p.066105-066105, Article 066105 [Periódico revisado por pares]

United States

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5
Three-dimensional high-resolution quantitative microscopy of extended crystals
Three-dimensional high-resolution quantitative microscopy of extended crystals
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Three-dimensional high-resolution quantitative microscopy of extended crystals

Godard, P ; Carbone, G ; Allain, M ; Mastropietro, F ; Chen, G ; Capello, L ; Diaz, A ; Metzger, T H ; Stangl, J ; Chamard, V

Nature communications, 2011-11, Vol.2 (1), p.568-568, Article 568 [Periódico revisado por pares]

England: Nature Publishing Group

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6
Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry
Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry
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Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry

Diaz, Ana ; Mocuta, Cristian ; Stangl, Julian ; Keplinger, Mario ; Weitkamp, Timm ; Pfeiffer, Franz ; David, Christian ; Metzger, Till H. ; Bauer, Günther

Journal of synchrotron radiation, 2010-05, Vol.17 (3), p.299-307 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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7
X-Ray Diffraction as a Local Probe Tool
X-Ray Diffraction as a Local Probe Tool
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X-Ray Diffraction as a Local Probe Tool

Stangl, J. ; Mocuta, C. ; Diaz, A. ; Metzger, T. H. ; Bauer, G.

Chemphyschem, 2009-12, Vol.10 (17), p.2923-2930 [Periódico revisado por pares]

Weinheim: WILEY-VCH Verlag

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8
Three-dimensional diffraction mapping by tuning the X-ray energy
Three-dimensional diffraction mapping by tuning the X-ray energy
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Three-dimensional diffraction mapping by tuning the X-ray energy

Cornelius, T. W. ; Carbone, D. ; Jacques, V. L. R. ; Schülli, T. U. ; Metzger, T. H.

Journal of synchrotron radiation, 2011-05, Vol.18 (3), p.413-417 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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9
Nanoscale structures and dynamics of a boundary liquid layer
Nanoscale structures and dynamics of a boundary liquid layer
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Nanoscale structures and dynamics of a boundary liquid layer

WALZ, M ; GERTH, S ; FALUS, P ; KLIMCZAK, M ; METZGER, T. H ; MAGERL, A

Journal of physics. Condensed matter, 2011-08, Vol.23 (32), p.324102-9 [Periódico revisado por pares]

Bristol: Institute of Physics

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10
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
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Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering

Carbone, D ; Alija, A ; Plantevin, O ; Gago, R ; Facsko, S ; Metzger, T H

Nanotechnology, 2008-01, Vol.19 (3), p.035304-035304 (5) [Periódico revisado por pares]

England: IOP Publishing

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