Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperatures
João Antonio Martino 1959- Eddy Simoen; Cor Claeys
Claeys, C.L.; Raider, S.I.; Brown, W.D.; Kirschman, R.K. Low Temperature Electronics and High Temperature Superconductivity Pennington: The Electrochemical Society, 1995
Pennington The Electrochemical Society 1995
Item não circula. Consulte sua biblioteca.(Acessar)
Combined 'delta' L and series resistance extraction of LDD MOSFETs at 77K
R Schreutelkamp João Antonio Martino 1959-; Eddy Simoen; L Deferm; Cor Claeys
Claeys, C.L.; Raider, S.I.; Brown, W.D.; Kirschman, R.K. Low Temperature Electronics and High Temperature Superconductivity Pennington: The Electrochemical Society, 1995
Pennington The Electrochemical Society 1995
Item não circula. Consulte sua biblioteca.(Acessar)
Influence of the back gate voltage on the total series resistence of fully depleted SOI MOSFETs at 300 K and 77 K
Aparecido Sirley Nicolett João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (17 2002 Porto Alegre, RS)
Morimoto, N.I.; Ribas, R.P.; Verdonck, P.B., eds Microelectronics Technology and Devices SBMICRO 2002 Pennington : The Electrochemical Society, 2002
Pennington The Electrochemical Society 2002
Item não circula. Consulte sua biblioteca.(Acessar)
Extraction of the silicon film trickness on fully depleted SOI nMOSFETs using the back gate voltage influence
Aparecido Sirley Nicolett João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Conference on Microelectronics and Packaging (15. 2000 Manaus)
The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETs
Luciano Mendes Camillo João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Silicon-on-Insulator Technology and Devices (12 2005 Quebec, Canada)
Celler,G.K; Cristoloveanu, S.; Gámiz, F.; Fossum, J.G.; Izumi, K. International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings Pennington: The Electrochemical Society, 2005
Pennington The Electrochemical Society 2005
Item não circula. Consulte sua biblioteca.(Acessar)
Theoretical and experimental study of the front and back interface trap density in accumulation mode soi mosfets at low temperature
João Antonio Martino 1959- Eddy Simoen; Cor Claeys; Symposium on Low Temperature Electronics and High Temperature Superconductivity (3. 1995 Reno); Electrochemical Society Meeting (187. 1995 Reno)
Temperature and oxide thickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs
Milene Galeti João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)
Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington: The Electrochemical Society, 2005. Proceedings v. 2005-08
Pennington The Electrochemical Society 2005
Item não circula. Consulte sua biblioteca.(Acessar)
Extraction of the oxide charge density at front and back interfaces of SOI NMOSFET devices
Aparecido Sirley Nicolett João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Silicon-on-Insulator Technology and Devices (10. 2001 Washington, DC)
Proceedings Pennington : The Electrochemical Society, 2001
Pennington The Electrochemical Society 2001
Item não circula. Consulte sua biblioteca.(Acessar)
Analysis of the linear kink effect in partially depleted SOI nMOSFETs
Paula Ghedini Der Agopian João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)
Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08
Pennington The Electrochemical Society 2005
Item não circula. Consulte sua biblioteca.(Acessar)