skip to main content
Idioma:

Resultados de 1 a 10 de 46  para Produção Intelectual da USP

Ordenado por: Ordenado por: RelevânciaOr hit Enter to replace sort method
Resultados 1 2 3 4 5 next page
Refinado por: autor: Claeys, C remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Comparison between 0.13Mm partially-depleted silicon-on-insulator technology with floating body operation at 300 K and 90 K
Comparison between 0.13Mm partially-depleted silicon-on-insulator technology with floating body operation at 300 K and 90 K
Material Type:
Livro 		Adicionar ao Meu Espaço

Comparison between 0.13Mm partially-depleted silicon-on-insulator technology with floating body operation at 300 K and 90 K

Marcelo Antonio Pavanello João Antonio Martino 1959-; A Mercha; J.M Rafi; Eddy Simoen; Cor Claeys; H Van Meer; K De Meyer; International Symposium on Microelectronics Technology and Devices SBMICRO 2002 (17 2002 Porto Alegre, RS)

Morimoto, N.I.; Ribas, P.R.; Verdonck, P.B., eds Microelectronics Technology and Devices SBMICRO 2002 Pennington : The Electrochemical Society, 2002

Pennington The Electrochemical Society 2002

Item não circula. Consulte sua biblioteca.(Acessar)

2
Microelectronics Technology and Devices SBMICRO 2005
Microelectronics Technology and Devices SBMICRO 2005
Material Type:
Livro 		Adicionar ao Meu Espaço

Microelectronics Technology and Devices SBMICRO 2005

Cor Claeys Jacobus Willibrordus Swart 1950-; Nilton Itiro Morimoto 1962-; Patrick Bernard Verdonck 1958-; International Symposium on Microelectronics Technology and Devices, SBMICRO (20 2005 Florianópolis, SC)

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

3
Temperature and oxide thickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs
Temperature and oxide thickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Temperature and oxide thickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs

Milene Galeti João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington: The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

4
Analysis of the linear kink effect in partially depleted SOI nMOSFETs
Analysis of the linear kink effect in partially depleted SOI nMOSFETs
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Analysis of the linear kink effect in partially depleted SOI nMOSFETs

Paula Ghedini Der Agopian João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

5
Comparison between bulk and floating body partially depleted SOI nMOSFETs for high frequency analog applications operating from 300 K down to 95 K
Comparison between bulk and floating body partially depleted SOI nMOSFETs for high frequency analog applications operating from 300 K down to 95 K
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Comparison between bulk and floating body partially depleted SOI nMOSFETs for high frequency analog applications operating from 300 K down to 95 K

Marcelo Antonio Pavanello João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

6
Influence of the back gate voltage on the total series resistence of fully depleted SOI MOSFETs at 300 K and 77 K
Influence of the back gate voltage on the total series resistence of fully depleted SOI MOSFETs at 300 K and 77 K
Material Type:
Livro 		Adicionar ao Meu Espaço

Influence of the back gate voltage on the total series resistence of fully depleted SOI MOSFETs at 300 K and 77 K

Aparecido Sirley Nicolett João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (17 2002 Porto Alegre, RS)

Morimoto, N.I.; Ribas, R.P.; Verdonck, P.B., eds Microelectronics Technology and Devices SBMICRO 2002 Pennington : The Electrochemical Society, 2002

Pennington The Electrochemical Society 2002

Item não circula. Consulte sua biblioteca.(Acessar)

7
The influence of the interface trap densities on the extraction of the silicon film and front oxide thickness of SOI NMOS devices at low temperatures
The influence of the interface trap densities on the extraction of the silicon film and front oxide thickness of SOI NMOS devices at low temperatures
Material Type:
Livro 		Adicionar ao Meu Espaço

The influence of the interface trap densities on the extraction of the silicon film and front oxide thickness of SOI NMOS devices at low temperatures

Aparecido Sirley Nicolett João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (17 2002 Porto Alegre, RS)

Morimoto, N.I.; Ribas, R.P.; Verdonck, P.B., eds Microelectronics Technology and Devices SBMICRO 2002 Pennington : The Electrochemical Society, 2002

Pennington The Electrochemical Society 2002

Item não circula. Consulte sua biblioteca.(Acessar)

8
Evaluation of the channel engineering impact on the analog performance of deep-submicrometer partially depleted SOI MOSFETS at low temperatures
Evaluation of the channel engineering impact on the analog performance of deep-submicrometer partially depleted SOI MOSFETS at low temperatures
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Evaluation of the channel engineering impact on the analog performance of deep-submicrometer partially depleted SOI MOSFETS at low temperatures

Marcelo Antonio Pavanello João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (19. 2004 Porto Galinhas)

Santos, E. J. P.; Ribas, R. P.; Swart, J. eds Microelectronic Technology and Devices SBMicro 2004. Proceedings, v. 2003-9 Pennington : The Electrochemical Society, 2004.

Pennington The Electrochemical Society 2004

Item não circula. Consulte sua biblioteca.(Acessar)

9
The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETs
The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETs
Material Type:
Livro 		Adicionar ao Meu Espaço

The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETs

Luciano Mendes Camillo João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Silicon-on-Insulator Technology and Devices (12 2005 Quebec, Canada)

Celler,G.K; Cristoloveanu, S.; Gámiz, F.; Fossum, J.G.; Izumi, K. International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings Pennington: The Electrochemical Society, 2005

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

10
Analysis of deep submicrometer bulk and fully depleted soi nmosfet analog operation at cryogenic temperatures
Analysis of deep submicrometer bulk and fully depleted soi nmosfet analog operation at cryogenic temperatures
Material Type:
Livro 		Adicionar ao Meu Espaço

Analysis of deep submicrometer bulk and fully depleted soi nmosfet analog operation at cryogenic temperatures

Marcelo Antonio Pavanello João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Silicon-on-Insulator Technology and Devices (12 2005 Quebec, Canada)

Celler,G.K; Cristoloveanu, S.; Gámiz, F.; Fossum, J.G.; Izumi, K. International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings Pennington: The Electrochemical Society, 2005

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

Resultados de 1 a 10 de 46  para Produção Intelectual da USP

Ordenado por: Ordenado por: RelevânciaOr hit Enter to replace sort method
Resultados 1 2 3 4 5 next page

Personalize Seus Resultados

  1. Editar

Refine Search Results

Refinar Meus Resultados

Tipo de Recurso 

  1. Artigos  (37)
  2. Livros  (9)
  3. Mais opções open sub menu

Data de Publicação 

De até
Refinar
  1. Antes de2003  (5)
  2. 2003Até2006  (9)
  3. 2007Até2011  (11)
  4. 2012Até2016  (18)
  5. Após 2016  (3)
  6. Mais opções open sub menu

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.