Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Book
|
Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperaturesJoão Antonio Martino 1959- Eddy Simoen; Cor ClaeysClaeys, C.L.; Raider, S.I.; Brown, W.D.; Kirschman, R.K. Low Temperature Electronics and High Temperature Superconductivity Pennington: The Electrochemical Society, 1995Pennington The Electrochemical Society 1995Check holdings(GetIt) |
|
2 |
Material Type: Book
|
Radiation Effects in Advanced Semiconductor Materials and DevicesClaeys E Simoen; Eddy SimoenSpringer Berlin Heidelberg 2002Online access. The library also has physical copies. |
|
3 |
Material Type: Book
|
Combined 'delta' L and series resistance extraction of LDD MOSFETs at 77KR Schreutelkamp João Antonio Martino 1959-; Eddy Simoen; L Deferm; Cor ClaeysClaeys, C.L.; Raider, S.I.; Brown, W.D.; Kirschman, R.K. Low Temperature Electronics and High Temperature Superconductivity Pennington: The Electrochemical Society, 1995Pennington The Electrochemical Society 1995Check holdings(GetIt) |
|
4 |
Material Type: Book
|
Influence of the back gate voltage on the total series resistence of fully depleted SOI MOSFETs at 300 K and 77 KAparecido Sirley Nicolett João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (17 2002 Porto Alegre, RS)Morimoto, N.I.; Ribas, R.P.; Verdonck, P.B., eds Microelectronics Technology and Devices SBMICRO 2002 Pennington : The Electrochemical Society, 2002Pennington The Electrochemical Society 2002Check holdings(GetIt) |
|
5 |
Material Type: Conference Paper
|
Extraction of the silicon film trickness on fully depleted SOI nMOSFETs using the back gate voltage influenceAparecido Sirley Nicolett João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Conference on Microelectronics and Packaging (15. 2000 Manaus)SBMicro 2000 : proceedings Manaus : SBMicro/UA/UFRGS/UNICAMP/USP, 2000Manaus SBMicro/UA/UFRGS/UNICAMP/USP 2000Check holdings(GetIt) |
|
6 |
Material Type: Book
|
The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETsLuciano Mendes Camillo João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Silicon-on-Insulator Technology and Devices (12 2005 Quebec, Canada)Celler,G.K; Cristoloveanu, S.; Gámiz, F.; Fossum, J.G.; Izumi, K. International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings Pennington: The Electrochemical Society, 2005Pennington The Electrochemical Society 2005Check holdings(GetIt) |
|
7 |
Material Type: Conference Paper
|
Theoretical and experimental study of the front and back interface trap density in accumulation mode soi mosfets at low temperatureJoão Antonio Martino 1959- Eddy Simoen; Cor Claeys; Symposium on Low Temperature Electronics and High Temperature Superconductivity (3. 1995 Reno); Electrochemical Society Meeting (187. 1995 Reno)Pennington v.1 , n.525, p.812-3, 1995 Extended AbstractsPennington 1995Check holdings(GetIt) |
|
8 |
Material Type: Conference Paper
|
Temperature and oxide thickness influence on the generation lifetime determination in partially depleted SOI nMOSFETsMilene Galeti João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington: The Electrochemical Society, 2005. Proceedings v. 2005-08Pennington The Electrochemical Society 2005Check holdings(GetIt) |
|
9 |
Material Type: Conference Paper
|
Soi mesfet modo acumulacao em 77 k impacto dos efeitos transitorios e determinacao da densidade de armadilhas de interfaceJoão Antonio Martino 1959- Eddy Simoen; Antônio Luís Pacheco Rotondaro; Ulf Magnusson; Cor Claeys; Congresso da Sociedade Brasileira de Microeletronica (8. 1993 Campinas)Anais Campinas : Sbmicro, 1993Campinas Sbmicro 1993Check holdings(GetIt) |
|
10 |
Material Type: Conference Paper
|
Extraction of the oxide charge density at front and back interfaces of SOI NMOSFET devicesAparecido Sirley Nicolett João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Silicon-on-Insulator Technology and Devices (10. 2001 Washington, DC)Proceedings Pennington : The Electrochemical Society, 2001Pennington The Electrochemical Society 2001Check holdings(GetIt) |