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Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs

Eddy Simoen Cor Claeys; N Lukyanchikova; M Petrichuk; N Garbar; João Antonio Martino 1959-; Victor Sonnenberg; International Symposium on Silicon-on-Insulator Technology and Devices (7th 1996 Los Angeles)

Hemment, P.L.F.; Cristoloveanu, S.; Izumi, K.; Houston, T.; Wilson, S. Seventh International Symposium on Silicon-on-Insulator Technology and Devices: proceedings Pennington: The Electrochemical Society, 1996

Pennington The Electrochemical Society 1996

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Article
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Improved analytical model for ZTC bias point for strained Tri-gates FinFETs

Luciano Mendes Almeida João Antonio Martino 1959-; Eddy Simoen; Cor Claeys

Microelectronics Technology and Devices - SBMicro 2010 v.31, n.1, p. 385-392, 2010

New Jersey 2010

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Article
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Improved analytical model for ZTC bias point for strained Tri-gates FinFETs

Luciano Mendes Almeida João Antonio Martino 1959-; Eddy Simoen; Cor Claeys

Microelectronics Technology and Devices - SBMicro 2010 v.31, n.1, p. 385-392, 2010

New Jersey 2010

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by this author/creator:

  1. Claeys, C
  2. Martino, J
  3. Simoen, E
  4. Almeida, L
  5. Lukyanchikova, N

on this subject:

  1. Microeletrônica

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