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DIBL behavior of triple gate FinFETs with SEG on biaxial strained devices
DIBL behavior of triple gate FinFETs with SEG on biaxial strained devices
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DIBL behavior of triple gate FinFETs with SEG on biaxial strained devices

Sara Dereste dos Santos Talitha Nicoletti; João Antonio Martino 1959-; Eddy Simoen; Cor Claeys

Microelectronics Technology and Devices - SBMicro 2010 v.31, n.1, p. 51-58, 2010

New Jersey 2010

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by this author/creator:

  1. Claeys, C
  2. Santos, S
  3. Martino, J
  4. Nicoletti, T
  5. Simoen, E

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