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Material Type: Ata de Congresso
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The application of LIBS for the analysis of archaeological ceramic and metal artifactsMELESSANAKI, Kristalia ; MATEO, Maripaz ; FERRENCE, Susan C ; BETANCOURT, Philip P ; ANGLOS, DemetriosApplied surface science, 2002, Vol.197-98, p.156-163 [Periódico revisado por pares]Amsterdam: Elsevier ScienceTexto completo disponível |
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Material Type: Ata de Congresso
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CMOS VCOs for frequency synthesis in wireless biotelemetryBetancourt-Zamora, Rafael J. ; Lee, Thomas H.International Symposium on Low Power Electronics and Design: Proceedings of the 1998 international symposium on Low power electronics and design; 10-12 Aug. 1998, 1998, p.91-94New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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Time of Wetness and Temperature as Tools to Evaluate Corrosion Risk in Concrete Blocks Exposed to a Humid Tropical EnvironmentCastro, P ; Véleva, LPMarine Corrosion in Tropical Environments, 2000, p.159-169 [Periódico revisado por pares]100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959: ASTM InternationalTexto completo disponível |
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Material Type: Ata de Congresso
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A fault model for function and delay testingJoonhwan Yi ; Hayes, J.P.IEEE European Test Workshop, 2001, 2001, p.27-34IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Electrical Conductivity of Concrete and Mortar Prepared with Calcareous Aggregates for Construction in the Gulf of MexicoMaldonado, LMarine Corrosion in Tropical Environments, 2000, p.150-158 [Periódico revisado por pares]100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959: ASTM InternationalTexto completo disponível |
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Material Type: Ata de Congresso
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Compact and complete test set generation for multiple stuck-faultsAgrawal, Alok ; Saldanha, Alexander ; Lavagno, Luciano ; Sangiovanni-Vincentelli, Alberto L.International Conference on Computer Aided Design: Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design; 10-14 Nov. 1996, 1997, p.212-219Washington, DC, USA: IEEE Computer SocietyTexto completo disponível |