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Refinado por: data de publicação: 1997Até2002 remover tipo de recurso: Anais de Congresso remover
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1
The application of LIBS for the analysis of archaeological ceramic and metal artifacts
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Ata de Congresso
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The application of LIBS for the analysis of archaeological ceramic and metal artifacts

MELESSANAKI, Kristalia ; MATEO, Maripaz ; FERRENCE, Susan C ; BETANCOURT, Philip P ; ANGLOS, Demetrios

Applied surface science, 2002, Vol.197-98, p.156-163 [Periódico revisado por pares]

Amsterdam: Elsevier Science

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2
CMOS VCOs for frequency synthesis in wireless biotelemetry
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Ata de Congresso
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CMOS VCOs for frequency synthesis in wireless biotelemetry

Betancourt-Zamora, Rafael J. ; Lee, Thomas H.

International Symposium on Low Power Electronics and Design: Proceedings of the 1998 international symposium on Low power electronics and design; 10-12 Aug. 1998, 1998, p.91-94

New York, NY, USA: ACM

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3
Time of Wetness and Temperature as Tools to Evaluate Corrosion Risk in Concrete Blocks Exposed to a Humid Tropical Environment
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Ata de Congresso
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Time of Wetness and Temperature as Tools to Evaluate Corrosion Risk in Concrete Blocks Exposed to a Humid Tropical Environment

Castro, P ; Véleva, LP

Marine Corrosion in Tropical Environments, 2000, p.159-169 [Periódico revisado por pares]

100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959: ASTM International

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4
A fault model for function and delay testing
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A fault model for function and delay testing

Joonhwan Yi ; Hayes, J.P.

IEEE European Test Workshop, 2001, 2001, p.27-34

IEEE

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5
Electrical Conductivity of Concrete and Mortar Prepared with Calcareous Aggregates for Construction in the Gulf of Mexico
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Electrical Conductivity of Concrete and Mortar Prepared with Calcareous Aggregates for Construction in the Gulf of Mexico

Maldonado, L

Marine Corrosion in Tropical Environments, 2000, p.150-158 [Periódico revisado por pares]

100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959: ASTM International

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6
Compact and complete test set generation for multiple stuck-faults
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Ata de Congresso
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Compact and complete test set generation for multiple stuck-faults

Agrawal, Alok ; Saldanha, Alexander ; Lavagno, Luciano ; Sangiovanni-Vincentelli, Alberto L.

International Conference on Computer Aided Design: Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design; 10-14 Nov. 1996, 1997, p.212-219

Washington, DC, USA: IEEE Computer Society

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