Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Application of LIBS in the analysis of archaeological objectsMelessanaki, Kristalia ; Ferrence, Susan C ; Betancourt, Philip P ; Anglos, DmitriosSPIE 2003Texto completo disponível |
2 |
Material Type: Ata de Congresso
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Noncontact fiber optic micrometerBETANCOURT IBARRA, F ; GUAJARDO-GONZALEZ, Candelario ; CASTILLO-GUZMAN, Arturo ; GUZMAN-RAMOS, Valentin ; SELVAS, RomeoProceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7839Bellingham, Wash: SPIETexto completo disponível |
3 |
Material Type: Ata de Congresso
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Development of radiation hard semiconductor sensors for charged particle tracking at very high luminositiesBetancourt, Christopher ; Fadeyev, Vitaliy ; Sadrozinski, Hartmut F ; Wright, JohnProceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7817, p.78170J-78170J-10Bellingham, Wash: SPIETexto completo disponível |
4 |
Material Type: Ata de Congresso
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Status and path to a final EUVL reticle-handling solutionHe, Long ; Orvek, Kevin ; Seidel, Phil ; Wurm, Stefan ; Underwood, Jon ; Betancourt, ErnieProceedings of SPIE, the International Society for Optical Engineering, 2007, Vol.6517, p.65171O-65171O-10Bellingham WA: SPIETexto completo disponível |
5 |
Material Type: Ata de Congresso
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STATUS OF EUV RETICLE HANDLING SOLUTION IN MEETING 32 NM HP EUV LITHOGRARPHYLONG HE ; WURM, Stefan ; SEIDEL, Phil ; ORVEK, Kevin ; BETANCOURT, Ernie ; UNDERWOOD, JonProceedings of SPIE, the International Society for Optical Engineering, 2008, p.69211Z.1-69211Z.10Bellingham, Wash: SPIETexto completo disponível |
6 |
Material Type: Ata de Congresso
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High-speed gallium arsenide transversal filter circuit for clutter rejection systemsWhite, Spencer W ; Betancourt-Zamora, Rafael JSPIE 1990Texto completo disponível |
7 |
Material Type: Ata de Congresso
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Nanostructured metal-insulator-metal resonators for high-resolution color filtering and spectral imagingTING XU ; WU, Yi-Kuei ; GUO, L. JayProceedings of SPIE, the International Society for Optical Engineering, 2011, Vol.7946Bellingham WA: SPIETexto completo disponível |