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Refinado por: Nome da Publicação: Review Of Scientific Instruments remover American Institute of Physics remover Base de dados/Biblioteca: Copper Technical Reference Library remover
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An ultrafast angle-resolved photoemission apparatus for measuring complex materials
An ultrafast angle-resolved photoemission apparatus for measuring complex materials
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An ultrafast angle-resolved photoemission apparatus for measuring complex materials

Smallwood, Christopher L ; Jozwiak, Christopher ; Zhang, Wentao ; Lanzara, Alessandra

Review of scientific instruments, 2012-12, Vol.83 (12), p.123904-123904 [Periódico revisado por pares]

United States

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2
Note: measuring effects of Ar-ion cleaning on the secondary electron yield of copper due to electron impact
Note: measuring effects of Ar-ion cleaning on the secondary electron yield of copper due to electron impact
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Note: measuring effects of Ar-ion cleaning on the secondary electron yield of copper due to electron impact

Zhang, Hai-Bo ; Hu, Xiao-Chuan ; Wang, Rui ; Cao, Meng ; Zhang, Na ; Cui, Wan-Zhao

Review of scientific instruments, 2012-06, Vol.83 (6), p.066105-066105 [Periódico revisado por pares]

United States

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3
Novel temperature dependent tensile test of freestanding copper thin film structures
Novel temperature dependent tensile test of freestanding copper thin film structures
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Novel temperature dependent tensile test of freestanding copper thin film structures

Smolka, M. ; Motz, C. ; Detzel, T. ; Robl, W. ; Griesser, T. ; Wimmer, A. ; Dehm, G.

Review of scientific instruments, 2012-06, Vol.83 (6), p.064702-064702-9 [Periódico revisado por pares]

United States: American Institute of Physics

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4
A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics
A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics
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A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics

Weber, J C ; Schlager, J B ; Sanford, N A ; Imtiaz, A ; Wallis, T M ; Mansfield, L M ; Coakley, K J ; Bertness, K A ; Kabos, P ; Bright, V M

Review of Scientific Instruments, 2012-08, Vol.83 (8), p.083702-083702 [Periódico revisado por pares]

United States

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5
Twin sample chamber for simultaneous comparative transport measurements in a diamond anvil cell
Twin sample chamber for simultaneous comparative transport measurements in a diamond anvil cell
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Twin sample chamber for simultaneous comparative transport measurements in a diamond anvil cell

Schaeffer, Anne Marie J ; Deemyad, Shanti

Review of scientific instruments, 2013-09, Vol.84 (9), p.095108-095108 [Periódico revisado por pares]

United States

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6
A reliable control system for measurement on film thickness in copper chemical mechanical planarization system
A reliable control system for measurement on film thickness in copper chemical mechanical planarization system
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A reliable control system for measurement on film thickness in copper chemical mechanical planarization system

Li, Hongkai ; Qu, Zilian ; Zhao, Qian ; Tian, Fangxin ; Zhao, Dewen ; Meng, Yonggang ; Lu, Xinchun

Review of scientific instruments, 2013-12, Vol.84 (12), p.125101-125101 [Periódico revisado por pares]

United States: American Institute of Physics

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7
Towards a beyond 1 GHz solid-state nuclear magnetic resonance: External lock operation in an external current mode for a 500 MHz nuclear magnetic resonance
Towards a beyond 1 GHz solid-state nuclear magnetic resonance: External lock operation in an external current mode for a 500 MHz nuclear magnetic resonance
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Towards a beyond 1 GHz solid-state nuclear magnetic resonance: External lock operation in an external current mode for a 500 MHz nuclear magnetic resonance

Takahashi, Masato ; Ebisawa, Yusuke ; Tennmei, Konosuke ; Yanagisawa, Yoshinori ; Hosono, Masami ; Takasugi, Kenji ; Hase, Takashi ; Miyazaki, Takayoshi ; Fujito, Teruaki ; Nakagome, Hideki ; Kiyoshi, Tsukasa ; Yamazaki, Toshio ; Maeda, Hideaki

Review of scientific instruments, 2012-10, Vol.83 (10), p.105110-105110 [Periódico revisado por pares]

United States

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8
Analysis of temporal jitter in a copper vapor laser system
Analysis of temporal jitter in a copper vapor laser system
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Analysis of temporal jitter in a copper vapor laser system

Kumar, D. Durga Praveen ; Gantayet, L. M. ; Singh, Sunita ; Rawat, A. S. ; Rana, Paramjit ; V, Rajasree ; Agarwalla, Sandeep K. ; Chakravarthy, D. P.

Review of scientific instruments, 2012-02, Vol.83 (2), p.025105-025105-5 [Periódico revisado por pares]

United States: American Institute of Physics

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9
System to measure accurate temperature dependence of electric conductivity down to 20 K in ultrahigh vacuum
System to measure accurate temperature dependence of electric conductivity down to 20 K in ultrahigh vacuum
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System to measure accurate temperature dependence of electric conductivity down to 20 K in ultrahigh vacuum

Sakai, C ; Takeda, S N ; Daimon, H

Review of scientific instruments, 2013-07, Vol.84 (7), p.075103-075103 [Periódico revisado por pares]

United States

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10
A wavelength modulation system for highly sensitive absorption spectroscopy
A wavelength modulation system for highly sensitive absorption spectroscopy
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A wavelength modulation system for highly sensitive absorption spectroscopy

Iwamitsu, K ; Aihara, S ; Shimamoto, T ; Fujii, A ; Akai, I

Review of scientific instruments, 2012-07, Vol.83 (7), p.073101-073101 [Periódico revisado por pares]

United States

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