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Refinado por: Nome da Publicação: Review Of Scientific Instruments remover xxx: xxx remover
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1
Reconvolution analysis in time‐resolved fluorescence experiments—an alternative approach: Reference‐to‐excitation‐to‐fluorescence reconvolution
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Reconvolution analysis in time‐resolved fluorescence experiments—an alternative approach: Reference‐to‐excitation‐to‐fluorescence reconvolution

Večeř, J. ; Kowalczyk, A. A. ; Davenport, L. ; Dale, R. E.

Review of scientific instruments, 1993-12, Vol.64 (12), p.3413-3424 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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2
Surface fluctuation spectroscopy: Comments on experimental technique and capillary ripple theory
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Surface fluctuation spectroscopy: Comments on experimental technique and capillary ripple theory

Mann, J. Adin ; Edwards, Robert V.

Review of scientific instruments, 1984-05, Vol.55 (5), p.727-731 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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3
Instrument and method for measuring second-order nonlinear optical tensors
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Instrument and method for measuring second-order nonlinear optical tensors

Armstrong, Darrell J. ; Pack, Michael V. ; Smith, Arlee V.

Proposed for publication in Review of Scientific Instruments, 2003-07, Vol.74 (7), p.3250-3257 [Periódico revisado por pares]

United States

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4
A system to measure isomeric state half-lives in the 10 ns to 10 μs range
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A system to measure isomeric state half-lives in the 10 ns to 10 μs range

Toufen, D. L. ; Allegro, P. R. P. ; Medina, N. H. ; Oliveira, J. R. B. ; Cybulska, E. W. ; Seale, W. A. ; Linares, R. ; Silveira, M. A. G. ; Ribas, R. V.

Review of scientific instruments, 2014-07, Vol.85 (7), p.073501-073501 [Periódico revisado por pares]

United States: American Institute of Physics

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5
Development and assessment of a microwave void-fraction measurement system
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Development and assessment of a microwave void-fraction measurement system

Pochet, S ; Teyssedou, A ; Akyel, C

Review of scientific instruments, 2014-01, Vol.85 (1), p.015103-015103 [Periódico revisado por pares]

United States: American Institute of Physics

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6
Development of nondestructive non-contact acousto-thermal evaluation technique for damage detection in materials
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Development of nondestructive non-contact acousto-thermal evaluation technique for damage detection in materials

Sathish, Shamachary ; Welter, John T. ; Jata, Kumar V. ; Schehl, Norman ; Boehnlein, Thomas

Review of scientific instruments, 2012-09, Vol.83 (9), p.095103-095103 [Periódico revisado por pares]

United States

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7
High-frequency demodulation of multi-photon fluorescence in hyper-Rayleigh scattering
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High-frequency demodulation of multi-photon fluorescence in hyper-Rayleigh scattering

Olbrechts, Geert ; Strobbe, Rik ; Clays, Koen ; Persoons, André

Review of scientific instruments, 1998-06, Vol.69 (6), p.2233-2241 [Periódico revisado por pares]

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8
ITER physics program and implications for plasma measurements
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ITER physics program and implications for plasma measurements

Mukhovatov, V. ; Costley, A. E. ; Bartiromo, R. ; Boucher, D. ; Fujisawa, N. ; Gribov, Yu ; Janeschitz, G. ; Johnson, L. ; Kasai, S. ; de Kock, L. ; Marmar, E. ; Muraoka, K. ; Nagashima, A. ; Orlinski, D. ; Ortolani, S. ; Perkins, F. ; Petrov, M. ; Post, D. ; Putvinski, S. ; Rosenbluth, M. ; Sauter, O. ; Stott, P. E. ; Strelkov, V. ; Vayakis, G. ; Walker, C. ; Wesley, J. C. ; Yamamoto, S. ; Young, K. M.

Review of Scientific Instruments, 1997-02, Vol.68 (2), p.1250-1255 [Periódico revisado por pares]

United States

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9
A transputer‐based measuring system for decentralized signal processing, applied to two‐phase flow
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A transputer‐based measuring system for decentralized signal processing, applied to two‐phase flow

Schmitt, A. ; Hoffmann, K. ; Loth, R.

Review of scientific instruments, 1995-10, Vol.66 (10), p.5045-5049 [Periódico revisado por pares]

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10
High-resolution compact Johann crystal spectrometer with the Livermore electron beam ion trap
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High-resolution compact Johann crystal spectrometer with the Livermore electron beam ion trap

Robbins, D. L. ; Chen, H. ; Beiersdorfer, P. ; Faenov, A. Ya ; Pikuz, T. A. ; May, M. J. ; Dunn, J. ; Smith, A. J.

Review of Scientific Instruments, 2004-10, Vol.75 (10), p.3717-3719 [Periódico revisado por pares]

United States

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