Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Comparison of surgical conditions during propofol or sevoflurane anaesthesia for endoscopic sinus surgeryAhn, H.J. ; Chung, S.-K. ; Dhong, H.-J. ; Kim, H.Y. ; Ahn, J.H. ; Lee, S.M. ; Hahm, T.S. ; Kim, J.K.British journal of anaesthesia : BJA, 2008-01, Vol.100 (1), p.50-54 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
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2 |
Material Type: Artigo
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Sinonasal Inverted Papilloma: Value of Convoluted Cerebriform Pattern on MR ImagingJeon, T.Y ; Kim, H.-J ; Chung, S.-K ; Dhong, H.-J ; Kim, H.Y ; Yim, Y.J ; Kim, S.T ; Jeon, P ; Kim, K.HAmerican journal of neuroradiology : AJNR, 2008-09, Vol.29 (8), p.1556-1560 [Periódico revisado por pares]Oak Brook, IL: Am Soc NeuroradiologyTexto completo disponível |
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3 |
Material Type: Artigo
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Sinonasal Organized Hematoma: CT and MR Imaging FindingsKim, S.T ; Jeon, P ; Ko, Y.-H ; Kim, E.Y ; Kim, H.-J ; Chung, S.-K ; Dhong, H.-J ; Kim, H.Y ; Yim, Y.JAmerican journal of neuroradiology : AJNR, 2008-06, Vol.29 (6), p.1204-1208 [Periódico revisado por pares]Oak Brook, IL: Am Soc NeuroradiologyTexto completo disponível |
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4 |
Material Type: Artigo
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Focal Hyperostosis on CT of Sinonasal Inverted Papilloma as a Predictor of Tumor OriginLee, D.K ; Chung, S.K ; Dhong, H.-J ; Kim, H.Y ; Kim, H.-J ; Bok, K.HAmerican Journal of Neuroradiology, 2007-04, Vol.28 (4), p.618-621 [Periódico revisado por pares]Oak Brook, IL: Am Soc NeuroradiologyTexto completo disponível |
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5 |
Material Type: Artigo
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Cucurbitacin B, a novel in vivo potentiator of gemcitabine with low toxicity in the treatment of pancreatic cancerIwanski, Gabriela B ; Lee, Dhong H ; En‐Gal, Shlomit ; Doan, Ngan B ; Castor, Brandon ; Vogt, Marco ; Toh, Melvin ; Bokemeyer, Carsten ; Said, Jonathan W ; Thoennissen, Nils H ; Koeffler, H PhillipBritish journal of pharmacology, 2010-06, Vol.160 (4), p.998-1007 [Periódico revisado por pares]Oxford, UK: Blackwell Publishing LtdTexto completo disponível |
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6 |
Material Type: Artigo
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Predictive Capabilities of Serum Eosinophil Cationic Protein, Percentage of Eosinophils and Total Immunoglobulin E in Allergic Rhinitis without Bronchial AsthmaJung, YG ; Kim, KH ; Kim, HY ; Dhong, HJ ; Chung, SKJournal of international medical research, 2011-12, Vol.39 (6), p.2209-2216 [Periódico revisado por pares]London, England: SAGE PublicationsTexto completo disponível |
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7 |
Material Type: Artigo
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A fully pipelined single-precision floating-point unit in the synergistic processor element of a CELL processorHwa-Joon Oh ; Mueller, S.M. ; Jacobi, C. ; Tran, K.D. ; Cottier, S.R. ; Michael, B.W. ; Nishikawa, H. ; Totsuka, Y. ; Namatame, T. ; Yano, N. ; Machida, T. ; Dhong, S.H.IEEE journal of solid-state circuits, 2006-04, Vol.41 (4), p.759-771 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Extraocular muscle injury during endoscopic sinus surgery: a series of 10 cases at a single centerSohn, J.H. ; Hong, S.D. ; Kim, J.H. ; Dhong, H.-J. ; Chung, S.-K. ; Kim, H.Y. ; Oh, S.Y.Rhinology, 2014-09, Vol.52 (3), p.238-245 [Periódico revisado por pares]Texto completo disponível |
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9 |
Material Type: Artigo
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The microarchitecture of the synergistic processor for a cell processorFlachs, B. ; Asano, S. ; Dhong, S.H. ; Hofstee, H.P. ; Gervais, G. ; Roy Kim ; Le, T. ; Peichun Liu ; Leenstra, J. ; Liberty, J. ; Michael, B. ; Hwa-Joon Oh ; Mueller, S.M. ; Takahashi, O. ; Hatakeyama, A. ; Watanabe, Y. ; Yano, N. ; Brokenshire, D.A. ; Peyravian, M. ; Vandung To ; Iwata, E.IEEE journal of solid-state circuits, 2006-01, Vol.41 (1), p.63-70 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Circuit Design Techniques for a First-Generation Cell Broadband Engine ProcessorWarnock, J. ; Wendel, D. ; Aipperspach, T. ; Behnen, E. ; Cordes, R.A. ; Dhong, S.H. ; Hirairi, K. ; Murakami, H. ; Onishi, S. ; Pham, D.C. ; Pille, J. ; Posluszny, S.D. ; Takahashi, O. ; Huajun WenIEEE journal of solid-state circuits, 2006-08, Vol.41 (8), p.1692-1706 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |