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A fluorocarbon plastic scintillator for neutron detection: Proof of concept
A fluorocarbon plastic scintillator for neutron detection: Proof of concept
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A fluorocarbon plastic scintillator for neutron detection: Proof of concept

Hamel, Matthieu ; Sibczynski, Pawel ; Blanc, Pauline ; Iwanowska, Joanna ; Carrel, Frédérick ; Syntfeld-Każuch, Agnieszka ; Normand, Stéphane

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2014-12, Vol.768 (5), p.26-31 [Periódico revisado por pares]

Elsevier B.V

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Dark-field electron holography for the measurement of geometric phase
Dark-field electron holography for the measurement of geometric phase
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Dark-field electron holography for the measurement of geometric phase

Hÿtch, M.J. ; Houdellier, F. ; Hüe, F. ; Snoeck, E.

Ultramicroscopy, 2011-07, Vol.111 (8), p.1328-1337 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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Liquid Phase Epitaxy growth of Tm3+-doped CaF2 thin-films based on LiF solvent
Liquid Phase Epitaxy growth of Tm3+-doped CaF2 thin-films based on LiF solvent
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Liquid Phase Epitaxy growth of Tm3+-doped CaF2 thin-films based on LiF solvent

Brasse, Gurvan ; Loiko, Pavel ; Grygiel, Clara ; Leprince, Philippe ; Benayad, Abdelmjid ; Lemarie, Franck ; Doualan, Jean-Louis ; Braud, Alain ; Camy, Patrice

Journal of alloys and compounds, 2019-09, Vol.803, p.442-449 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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4
Surface electrostatic potentials in carbon nanotubes and graphene membranes investigated with electron holography
Surface electrostatic potentials in carbon nanotubes and graphene membranes investigated with electron holography
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Surface electrostatic potentials in carbon nanotubes and graphene membranes investigated with electron holography

Ortolani, Luca ; Houdellier, Florent ; Monthioux, Marc ; Snoeck, Etienne ; Morandi, Vittorio

Carbon (New York), 2011-04, Vol.49 (4), p.1423-1429 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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5
Chirality dependent surface adhesion of single-walled carbon nanotubes on graphene surfaces
Chirality dependent surface adhesion of single-walled carbon nanotubes on graphene surfaces
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Chirality dependent surface adhesion of single-walled carbon nanotubes on graphene surfaces

Ortolani, Luca ; Houdellier, Florent ; Monthioux, Marc ; Morandi, Vittorio

Carbon (New York), 2010-09, Vol.48 (11), p.3050-3056 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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6
Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography
Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography
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Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography

Hüe, Florian ; Hytch, Martin ; Houdellier, Florent ; Snoeck, Etienne ; Claverie, Alain

Materials science & engineering. B, Solid-state materials for advanced technology, 2008-12, Vol.154, p.221-224 [Periódico revisado por pares]

Elsevier B.V

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7
Amorphization of oxides in ODS steels/materials by electronic stopping power
Amorphization of oxides in ODS steels/materials by electronic stopping power
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Amorphization of oxides in ODS steels/materials by electronic stopping power

Monnet, I. ; Grygiel, C. ; Lescoat, M.L. ; Ribis, J.

Journal of nuclear materials, 2012-05, Vol.424 (1-3), p.12-16 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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8
A multi-criteria approach to evaluate the natural gas energy systems
A multi-criteria approach to evaluate the natural gas energy systems
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A multi-criteria approach to evaluate the natural gas energy systems

Dinca, Cristian ; Badea, Adrian ; Rousseaux, Patrick ; Apostol, Tiberiu

Energy policy, 2007-11, Vol.35 (11), p.5754-5765 [Periódico revisado por pares]

Oxford: Elsevier Ltd

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9
Fatigue of single crystalline silicon: Mechanical behaviour and TEM observations
Fatigue of single crystalline silicon: Mechanical behaviour and TEM observations
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Fatigue of single crystalline silicon: Mechanical behaviour and TEM observations

Legros, Marc ; Ferry, Olivier ; Houdellier, Florent ; Jacques, Alain ; George, Amand

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2008-06, Vol.483, p.353-364 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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10
High-resolution electron holography for the study of composition and strain in thin film semiconductors
High-resolution electron holography for the study of composition and strain in thin film semiconductors
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High-resolution electron holography for the study of composition and strain in thin film semiconductors

Houdellier, F. ; Hÿtch, M.J. ; Snoeck, E. ; Casanove, M.J.

Materials science & engineering. B, Solid-state materials for advanced technology, 2006-12, Vol.135 (3), p.188-191 [Periódico revisado por pares]

Elsevier B.V

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