Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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A fluorocarbon plastic scintillator for neutron detection: Proof of conceptHamel, Matthieu ; Sibczynski, Pawel ; Blanc, Pauline ; Iwanowska, Joanna ; Carrel, Frédérick ; Syntfeld-Każuch, Agnieszka ; Normand, StéphaneNuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2014-12, Vol.768 (5), p.26-31 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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Dark-field electron holography for the measurement of geometric phaseHÿtch, M.J. ; Houdellier, F. ; Hüe, F. ; Snoeck, E.Ultramicroscopy, 2011-07, Vol.111 (8), p.1328-1337 [Periódico revisado por pares]Netherlands: Elsevier B.VTexto completo disponível |
3 |
Material Type: Artigo
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Liquid Phase Epitaxy growth of Tm3+-doped CaF2 thin-films based on LiF solventBrasse, Gurvan ; Loiko, Pavel ; Grygiel, Clara ; Leprince, Philippe ; Benayad, Abdelmjid ; Lemarie, Franck ; Doualan, Jean-Louis ; Braud, Alain ; Camy, PatriceJournal of alloys and compounds, 2019-09, Vol.803, p.442-449 [Periódico revisado por pares]Lausanne: Elsevier B.VTexto completo disponível |
4 |
Material Type: Artigo
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Surface electrostatic potentials in carbon nanotubes and graphene membranes investigated with electron holographyOrtolani, Luca ; Houdellier, Florent ; Monthioux, Marc ; Snoeck, Etienne ; Morandi, VittorioCarbon (New York), 2011-04, Vol.49 (4), p.1423-1429 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
5 |
Material Type: Artigo
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Chirality dependent surface adhesion of single-walled carbon nanotubes on graphene surfacesOrtolani, Luca ; Houdellier, Florent ; Monthioux, Marc ; Morandi, VittorioCarbon (New York), 2010-09, Vol.48 (11), p.3050-3056 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
6 |
Material Type: Artigo
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Strain mapping in MOSFETS by high-resolution electron microscopy and electron holographyHüe, Florian ; Hytch, Martin ; Houdellier, Florent ; Snoeck, Etienne ; Claverie, AlainMaterials science & engineering. B, Solid-state materials for advanced technology, 2008-12, Vol.154, p.221-224 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
7 |
Material Type: Artigo
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Amorphization of oxides in ODS steels/materials by electronic stopping powerMonnet, I. ; Grygiel, C. ; Lescoat, M.L. ; Ribis, J.Journal of nuclear materials, 2012-05, Vol.424 (1-3), p.12-16 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
8 |
Material Type: Artigo
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A multi-criteria approach to evaluate the natural gas energy systemsDinca, Cristian ; Badea, Adrian ; Rousseaux, Patrick ; Apostol, TiberiuEnergy policy, 2007-11, Vol.35 (11), p.5754-5765 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
9 |
Material Type: Artigo
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Fatigue of single crystalline silicon: Mechanical behaviour and TEM observationsLegros, Marc ; Ferry, Olivier ; Houdellier, Florent ; Jacques, Alain ; George, AmandMaterials science & engineering. A, Structural materials : properties, microstructure and processing, 2008-06, Vol.483, p.353-364 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
10 |
Material Type: Artigo
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High-resolution electron holography for the study of composition and strain in thin film semiconductorsHoudellier, F. ; Hÿtch, M.J. ; Snoeck, E. ; Casanove, M.J.Materials science & engineering. B, Solid-state materials for advanced technology, 2006-12, Vol.135 (3), p.188-191 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |