skip to main content
Idioma:
Resultados 1 2 3 4 5 next page
Refinado por: Base de dados/Biblioteca: Journals@Ovid Ovid Full Text remover tipo de recurso: magazinearticle remover Inglês remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
An Interactive Simulation and Visualization Tool for Conventional and Aberration-Corrected Transmission Electron Microscopy
An Interactive Simulation and Visualization Tool for Conventional and Aberration-Corrected Transmission Electron Microscopy
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

An Interactive Simulation and Visualization Tool for Conventional and Aberration-Corrected Transmission Electron Microscopy

Li, X.-Z.

Microscopy today, 2022-11, Vol.30 (6), p.20-27

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
2
A Real-Time Logging System for Managing Multiuser Equipment
A Real-Time Logging System for Managing Multiuser Equipment
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

A Real-Time Logging System for Managing Multiuser Equipment

Li, X.-Z.

Microscopy today, 2018-01, Vol.26 (1), p.26-29

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
3
JECP—a Java Electron Crystallography Project
JECP—a Java Electron Crystallography Project
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

JECP—a Java Electron Crystallography Project

Li, X.Z.

Microscopy today, 2006-09, Vol.14 (5), p.32-35

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
4
Ultra-Low kV EDS – A New Approach to Improved Spatial Resolution, Surface Sensitivity, and Light Element Compositional Imaging and Analysis in the SEM
Ultra-Low kV EDS – A New Approach to Improved Spatial Resolution, Surface Sensitivity, and Light Element Compositional Imaging and Analysis in the SEM
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Ultra-Low kV EDS – A New Approach to Improved Spatial Resolution, Surface Sensitivity, and Light Element Compositional Imaging and Analysis in the SEM

Burgess, Simon ; Sagar, James ; Holland, James ; Li, Xiaobing ; Bauer, Frank

Microscopy today, 2017-03, Vol.25 (2), p.20-29

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
5
X-Ray Detectors : A Changing World
X-Ray Detectors : A Changing World
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

X-Ray Detectors : A Changing World

Sareen, R.A. ; Nashashbi, T.

Microscopy today, 1996-09, Vol.4 (7), p.14-15

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
6
Microscopy and Microanalysis
Microscopy and Microanalysis
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Microscopy and Microanalysis

Microscopy today, 2018-01, Vol.26 (1), p.48-49

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
7
Micro-Scale Analysis of Microbial-Induced Calcite Precipitation in Sandy Soil through SEM/FIB Imaging
Micro-Scale Analysis of Microbial-Induced Calcite Precipitation in Sandy Soil through SEM/FIB Imaging
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Micro-Scale Analysis of Microbial-Induced Calcite Precipitation in Sandy Soil through SEM/FIB Imaging

Wen, Kejun ; Li, Lin ; Zhang, Rong ; Li, Yang ; Amini, Farshad

Microscopy today, 2019-01, Vol.27 (1), p.24-29

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
8
Aberration-Corrected S/TEM at Florida State University
Aberration-Corrected S/TEM at Florida State University
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Aberration-Corrected S/TEM at Florida State University

Xin, Yan ; Han, Ke ; Liang, Zhiyong ; Su, Yi-Feng ; Lee, Peter J. ; Larbalestier, David C.

Microscopy today, 2014-05, Vol.22 (3), p.42-49

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
9
Design and Construction of an Optical TEM Specimen Holder
Design and Construction of an Optical TEM Specimen Holder
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Design and Construction of an Optical TEM Specimen Holder

Martis, Joel ; Zhang, Ze ; Li, Hao-Kun ; Marshall, Ann ; Kim, Roy ; Majumdar, Arun

Microscopy today, 2021-09, Vol.29 (5), p.40-44

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
10
Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials
Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials

Park, Jun-Sang ; Zhang, Xuan ; Kenesei, Peter ; Wong, Su Leen ; Li, Meimei ; Almer, Jonathan

Microscopy today, 2017-09, Vol.25 (5), p.36-45

New York, USA: Cambridge University Press

Texto completo disponível

Citações Citado por
Resultados 1 2 3 4 5 next page

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.