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Material Type: magazinearticle
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An Interactive Simulation and Visualization Tool for Conventional and Aberration-Corrected Transmission Electron MicroscopyLi, X.-Z.Microscopy today, 2022-11, Vol.30 (6), p.20-27New York, USA: Cambridge University PressTexto completo disponível |
2 |
Material Type: magazinearticle
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A Real-Time Logging System for Managing Multiuser EquipmentLi, X.-Z.Microscopy today, 2018-01, Vol.26 (1), p.26-29New York, USA: Cambridge University PressTexto completo disponível |
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Material Type: magazinearticle
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JECP—a Java Electron Crystallography ProjectLi, X.Z.Microscopy today, 2006-09, Vol.14 (5), p.32-35New York, USA: Cambridge University PressTexto completo disponível |
4 |
Material Type: magazinearticle
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Ultra-Low kV EDS – A New Approach to Improved Spatial Resolution, Surface Sensitivity, and Light Element Compositional Imaging and Analysis in the SEMBurgess, Simon ; Sagar, James ; Holland, James ; Li, Xiaobing ; Bauer, FrankMicroscopy today, 2017-03, Vol.25 (2), p.20-29New York, USA: Cambridge University PressTexto completo disponível |
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Material Type: magazinearticle
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X-Ray Detectors : A Changing WorldSareen, R.A. ; Nashashbi, T.Microscopy today, 1996-09, Vol.4 (7), p.14-15New York, USA: Cambridge University PressTexto completo disponível |
6 |
Material Type: magazinearticle
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Microscopy and MicroanalysisMicroscopy today, 2018-01, Vol.26 (1), p.48-49New York, USA: Cambridge University PressTexto completo disponível |
7 |
Material Type: magazinearticle
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Micro-Scale Analysis of Microbial-Induced Calcite Precipitation in Sandy Soil through SEM/FIB ImagingWen, Kejun ; Li, Lin ; Zhang, Rong ; Li, Yang ; Amini, FarshadMicroscopy today, 2019-01, Vol.27 (1), p.24-29New York, USA: Cambridge University PressTexto completo disponível |
8 |
Material Type: magazinearticle
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Aberration-Corrected S/TEM at Florida State UniversityXin, Yan ; Han, Ke ; Liang, Zhiyong ; Su, Yi-Feng ; Lee, Peter J. ; Larbalestier, David C.Microscopy today, 2014-05, Vol.22 (3), p.42-49New York, USA: Cambridge University PressTexto completo disponível |
9 |
Material Type: magazinearticle
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Design and Construction of an Optical TEM Specimen HolderMartis, Joel ; Zhang, Ze ; Li, Hao-Kun ; Marshall, Ann ; Kim, Roy ; Majumdar, ArunMicroscopy today, 2021-09, Vol.29 (5), p.40-44New York, USA: Cambridge University PressTexto completo disponível |
10 |
Material Type: magazinearticle
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Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline MaterialsPark, Jun-Sang ; Zhang, Xuan ; Kenesei, Peter ; Wong, Su Leen ; Li, Meimei ; Almer, JonathanMicroscopy today, 2017-09, Vol.25 (5), p.36-45New York, USA: Cambridge University PressTexto completo disponível |