Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Quantitative Subsurface Atomic Structure Fingerprint for 2D Materials and Heterostructures by First-Principles-Calibrated Contact-Resonance Atomic Force MicroscopyTu, Qing ; Lange, Björn ; Parlak, Zehra ; Lopes, Joao Marcelo J ; Blum, Volker ; Zauscher, StefanACS nano, 2016-07, Vol.10 (7), p.6491-6500 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |
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2 |
Material Type: Artigo
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Molecular Beam Epitaxy of GaN Nanowires on Epitaxial GrapheneFernández-Garrido, Sergio ; Ramsteiner, Manfred ; Gao, Guanhui ; Galves, Lauren A ; Sharma, Bharat ; Corfdir, Pierre ; Calabrese, Gabriele ; de Souza Schiaber, Ziani ; Pfüller, Carsten ; Trampert, Achim ; Lopes, João Marcelo J ; Brandt, Oliver ; Geelhaar, LutzNano letters, 2017-09, Vol.17 (9), p.5213-5221 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |
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3 |
Material Type: Artigo
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Formation of high-quality quasi-free-standing bilayer graphene on SiC(0001) by oxygen intercalation upon annealing in airOliveira, Myriano H. ; Schumann, Timo ; Fromm, Felix ; Koch, Roland ; Ostler, Markus ; Ramsteiner, Manfred ; Seyller, Thomas ; Lopes, Joao Marcelo J. ; Riechert, HenningCarbon (New York), 2013-02, Vol.52, p.83-89 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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4 |
Material Type: Artigo
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Comparative study of Al-MCM materials prepared at room temperature with different aluminium sources and by some hydrothermal methodsRibeiro Carrott, M.M.L. ; Conceição, F.L. ; Lopes, J.M. ; Carrott, P.J.M. ; Bernardes, C. ; Rocha, J. ; Ramôa Ribeiro, F.Microporous and mesoporous materials, 2006-06, Vol.92 (1), p.270-285 [Periódico revisado por pares]Amsterdam: Elsevier IncTexto completo disponível |
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5 |
Material Type: Artigo
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Probing the Surface Tension of Ionic Liquids Using the Langmuir PrincipleShimizu, Karina ; Heller, Bettina S. J ; Maier, Florian ; Steinrück, Hans-Peter ; Canongia Lopes, José NLangmuir, 2018-04, Vol.34 (14), p.4408-4416 [Periódico revisado por pares]United States: American Chemical SocietyTexto completo disponível |
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6 |
Material Type: Artigo
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Stacking order effects on the energetics and electronic properties of n-doped graphene/h-BN van der Waals heterostructures on SiC(0001)Deus, Dominike P. de Andrade ; Lopes, João Marcelo J. ; Miwa, Roberto H.Carbon (New York), 2023-09, Vol.213, p.118244, Article 118244 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
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7 |
Material Type: Artigo
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The effect of the SiC(0001) surface morphology on the growth of epitaxial mono-layer graphene nanoribbonsGalves, L.A. ; Wofford, J.M. ; Soares, G.V. ; Jahn, U. ; Pfüller, C. ; Riechert, H. ; Lopes, J.M.J.Carbon (New York), 2017-05, Vol.115, p.162-168 [Periódico revisado por pares]New York: Elsevier LtdTexto completo disponível |
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8 |
Material Type: Artigo
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The role of substrate on the growth of 2D heterostructures by CVDFeijó, Taís Orestes ; Copetti, Gabriela ; Gerling, Ester Riedner Figini ; Hanke, Michael ; Lopes, João Marcelo J. ; Radtke, Cláudio ; Soares, Gabriel VieiraApplied surface science, 2021-02, Vol.539, p.148226, Article 148226 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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9 |
Material Type: Artigo
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Optical contrast in the near-field limit for structural characterization of graphene nanoribbonsFlores-Rangel, G. ; Lastras-Martínez, L.F. ; Castro-García, R. ; Ruiz-Cigarrillo, O. ; Balderas-Navarro, R.E. ; Espinosa-Cuellar, L.D. ; Lastras-Martínez, A. ; Lopes, J.M.J.Applied surface science, 2021-01, Vol.536, p.147710, Article 147710 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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10 |
Material Type: Artigo
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Mono- and few-layer nanocrystalline graphene grown on Al2O3(0001) by molecular beam epitaxyOliveira, Myriano H. ; Schumann, Timo ; Gargallo-Caballero, Raquel ; Fromm, Felix ; Seyller, Thomas ; Ramsteiner, Manfred ; Trampert, Achim ; Geelhaar, Lutz ; Lopes, Joao Marcelo J. ; Riechert, HenningCarbon (New York), 2013-05, Vol.56, p.339-350 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |