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High-throughput optical characterization for the development of a ZnO-based ultraviolet semiconductor-laser
High-throughput optical characterization for the development of a ZnO-based ultraviolet semiconductor-laser
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High-throughput optical characterization for the development of a ZnO-based ultraviolet semiconductor-laser

Makino, T ; Chia, C.H ; Segawa, Y ; Kawasaki, M ; Ohtomo, A ; Tamura, K ; Matsumoto, Y ; Koinuma, H

Applied surface science, 2002-04, Vol.189 (3), p.277-283 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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Interlayer dielectric process for LSI circuits using positive photosensitive polyimide synthesized by block-copolymerization
Interlayer dielectric process for LSI circuits using positive photosensitive polyimide synthesized by block-copolymerization
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Interlayer dielectric process for LSI circuits using positive photosensitive polyimide synthesized by block-copolymerization

Aoyagi, Masahiro ; Segawa, Shigemasa ; Jung, EunSil ; Itatani, Taro ; Komuro, Masanori ; Sakamoto, Tsuenenori ; Itatani, Hiroshi ; Miyamura, Masataka ; Matsumoto, Shunichi

SPIE proceedings series, 2001, Vol.4345, p.1073-1078

Bellingham WA: SPIE

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Influence of the c-axis orientation on the optical properties of thin CdS films formed by laser ablation
Influence of the c-axis orientation on the optical properties of thin CdS films formed by laser ablation
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Influence of the c-axis orientation on the optical properties of thin CdS films formed by laser ablation

DUSHKINA, N. M ; ULLRICH, B ; SAKAI, H ; EIJU, T ; SEGAWA, Y

SPIE proceedings series, 1999, p.424-432

Bellingham WA: SPIE

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Tunable ultraviolet solid-state lasers using large Ce:fluoride crystals and new pumping scheme
Tunable ultraviolet solid-state lasers using large Ce:fluoride crystals and new pumping scheme
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Tunable ultraviolet solid-state lasers using large Ce:fluoride crystals and new pumping scheme

Zhenlin Liu ; Shimamura, K. ; Nakano, K. ; Fukuda, T. ; Segawa, Y. ; Kozeki, T. ; Ohtake, H. ; Sarukura, N.

Nonlinear Optics: Materials, Fundamentals, and Applications. Technical Digest. Postconference Edition. TOPS Vol.46 (IEEE Cat. No.00CH37174), 2000, p.183-185

IEEE

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