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1
Direct Measurement of the Interactions of Amide Solvents with Single-Walled Carbon Nanotubes Using Isothermal Titration Calorimetry
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Direct Measurement of the Interactions of Amide Solvents with Single-Walled Carbon Nanotubes Using Isothermal Titration Calorimetry

Alston, Jeffrey R ; Overson, Devon ; Poler, Jordan C

Langmuir, 2012-01, Vol.28 (1), p.264-271 [Periódico revisado por pares]

Washington, DC: American Chemical Society

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2
STEM imaging of single Pd atoms in activated carbon fibers considered for hydrogen storage
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STEM imaging of single Pd atoms in activated carbon fibers considered for hydrogen storage

van Benthem, Klaus ; Bonifacio, Cecile S. ; Contescu, Cristian I. ; Gallego, Nidia C. ; Pennycook, Stephen J.

Carbon (New York), 2011-10, Vol.49 (12), p.4059-4063 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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Industrial processing of a novel Al–Cu–Mg powder metallurgy alloy
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Industrial processing of a novel Al–Cu–Mg powder metallurgy alloy

Boland, C.D. ; Hexemer, R.L. ; Donaldson, I.W. ; Bishop, D.P.

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2013-01, Vol.559, p.902-908 [Periódico revisado por pares]

Kidlington: Elsevier B.V

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4
Multilayer Self-Assembly of Amphiphilic Cyclodextrin Hosts on Bare and Modified Gold Substrates:  Controlling Aggregation via Surface Modification
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Multilayer Self-Assembly of Amphiphilic Cyclodextrin Hosts on Bare and Modified Gold Substrates:  Controlling Aggregation via Surface Modification

Godínez, Luis A ; Lin, James ; Muñoz, Marc ; Coleman, Anthony W ; Rubin, Shai ; Parikh, Atul ; Zawodzinski, Thomas A ; Loveday, David ; Ferraris, John P ; Kaifer, Angel E

Langmuir, 1998-01, Vol.14 (1), p.137-144 [Periódico revisado por pares]

Washington, DC: American Chemical Society

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5
Improvement of Ferroelectric and Leakage Current Properties with Zn-Mn Co-doping in BiFeO3 Thin Films
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Improvement of Ferroelectric and Leakage Current Properties with Zn-Mn Co-doping in BiFeO3 Thin Films

Lee, M. H. ; Lee, S. C. ; Sung, Y. S. ; Kim, M.-H. ; Song, T. K. ; Kim, W.-J. ; Do, D. ; Kim, S. S. ; Cho, J. H. ; Choi, B. C.

Ferroelectrics, 2010-01, Vol.401 (1), p.186-191 [Periódico revisado por pares]

Colchester: Taylor & Francis Group

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6
Novel tunneling technique for measuring electron scattering rates in superconductors: application to Sn and Sn-In films
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Novel tunneling technique for measuring electron scattering rates in superconductors: application to Sn and Sn-In films

YEN, Y ; LEMBERGER, T. R

Phys. Rev. B: Condens. Matter; (United States), 1988-03, Vol.37 (7), p.3324-3335

Woodbury, NY: American Physical Society

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7
Impact identification of stiffened composite panels: I. System development
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Impact identification of stiffened composite panels: I. System development

Seydel, Robert ; Chang, Fu-Kuo

Smart materials and structures, 2001-04, Vol.10 (2), p.354-369 [Periódico revisado por pares]

Bristol: IOP Publishing

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8
Minority carrier lifetime in p-HgCdTe
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Minority carrier lifetime in p-HgCdTe

KINCH, M. A ; AQARIDEN, F ; CHANDRA, D ; LIAO, P.-K ; SCHAAKE, H. F ; SHIH, H. D

Journal of electronic materials, 2005-06, Vol.34 (6), p.880-884 [Periódico revisado por pares]

New York, NY: Institute of Electrical and Electronics Engineers

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9
Structural and Electrochemical Properties of ICP/LiMn2O4 Composite Cathodes
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Structural and Electrochemical Properties of ICP/LiMn2O4 Composite Cathodes

Kim, Jin On ; Song, Min-Kyu ; Lee, Seung Won ; Cho, Byung Won ; Yun, Kyung Suk ; Rhee, Hee-Woo

Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals, 2000-01, Vol.349 (1), p.287-290

Philadelphia, PA: Taylor & Francis Group

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10
Effect of temperature on structural and optical properties of ZnS thin films by chemical bath deposition without stirring the reaction bath
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Effect of temperature on structural and optical properties of ZnS thin films by chemical bath deposition without stirring the reaction bath

Ke, Huan ; Duo, Shuwang ; Liu, Tingzhi ; Sun, Qi ; Ruan, Chengxiang ; Fei, Xiaoyan ; Tan, Jilin ; Zhan, Sheng

Materials science in semiconductor processing, 2014-02, Vol.18, p.28-35 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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