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Thorough Investigation of multipath Techniques in RPL based Wireless Networks
Thorough Investigation of multipath Techniques in RPL based Wireless Networks
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Thorough Investigation of multipath Techniques in RPL based Wireless Networks

Estrin, Ana Czarnitzki ; Lagos Jenschke, Tomas ; Papadopoulos, Georgios Z. ; Ignacio Alvarez-Hamelin, J. ; Montavont, Nicolas

2020 IEEE Symposium on Computers and Communications (ISCC), 2020, p.1-7

IEEE

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2
Comparative Study of Different BLE Fingerprint Reconstruction Techniques
Comparative Study of Different BLE Fingerprint Reconstruction Techniques
Material Type:
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Comparative Study of Different BLE Fingerprint Reconstruction Techniques

Parralejo, Felipe ; Aranda, Fernando J. ; Paredes, Jose A. ; Alvarez, Fernando J. ; Morera, Jorge

2021 International Conference on Indoor Positioning and Indoor Navigation (IPIN), 2021, p.1-8

IEEE

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3
Finding Optimal BLE Configuration for Indoor Positioning with Consumption Restrictions
Finding Optimal BLE Configuration for Indoor Positioning with Consumption Restrictions
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Finding Optimal BLE Configuration for Indoor Positioning with Consumption Restrictions

Aranda, Fernando J. ; Parralejo, Felipe ; Aguilera, Teodoro ; Alvarez, Fernando J. ; Torres-Sospedra, Joaquin

2021 International Conference on Indoor Positioning and Indoor Navigation (IPIN), 2021, p.1-8

IEEE

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4
VIS: the visible imager for Euclid
VIS: the visible imager for Euclid
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

VIS: the visible imager for Euclid

Cropper, Mark ; Pottinger, S ; Niemi, S ; Azzollini, R ; Denniston, J ; Szafraniec, M ; Awan, S ; Mellier, Y ; Berthe, M ; Martignac, J ; Cara, C ; Di Giorgio, A.-M ; Sciortino, A ; Bozzo, E ; Genolet, L ; Cole, R ; Philippon, A ; Hailey, M ; Hunt, T ; Swindells, I ; Holland, A ; Gow, J ; Murray, N ; Hall, D ; Skottfelt, J ; Amiaux, J ; Laureijs, R ; Racca, G ; Salvignol, J.-C ; Short, A ; Lorenzo Alvarez, J ; Kitching, T ; Hoekstra, H ; Massey, R ; Israel, H Siegler, Nicholas ; Tong, Edward C ; MacEwen, Howard A ; Lystrup, Makenzie ; Batalha, Natalie ; Fazio, Giovanni G

SPIE 2016

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5
A lightweight heliostat field post-optimizer
A lightweight heliostat field post-optimizer
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A lightweight heliostat field post-optimizer

Cruz, N. C. ; Salhi, S. ; Redondo, J. L. ; Álvarez, J. D. ; Berenguel, M. ; Ortigosa, P. M. Sergeyev, Yaroslav D. ; Emmerich, Michael T. M. ; Deutz, André H. ; Hille, Sander C.

AIP Conference Proceedings, 2019, Vol.2070 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

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6
VIS: the visible imager for Euclid
VIS: the visible imager for Euclid
Material Type:
Ata de Congresso 		Adicionar ao Meu Espaço

VIS: the visible imager for Euclid

Cropper, Mark ; Pottinger, S ; Niemi, S.-M ; Denniston, J ; Cole, R ; Szafraniec, M ; Mellier, Y ; Berthé, M ; Martignac, J ; Cara, C ; di Giorgio, A. M ; Sciortino, A ; Paltani, S ; Genolet, L ; Fourmand, J.-J ; Charra, M ; Guttridge, P ; Winter, B ; Endicott, J ; Holland, A ; Gow, J ; Murray, N ; Hall, D ; Amiaux, J ; Laureijs, R ; Racca, G ; Salvignol, J.-C ; Short, A ; Lorenzo Alvarez, J ; Kitching, T ; Hoekstra, H ; Massey, R MacEwen, Howard A ; Fazio, Giovanni G ; Oschmann, Jacobus M ; Clampin, Mark

SPIE 2014

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7
Methodology for Active Junction Profile Extraction in thin film FD-SOI Enabling performance driver identification in 500°C devices for 3D sequential integration
Methodology for Active Junction Profile Extraction in thin film FD-SOI Enabling performance driver identification in 500°C devices for 3D sequential integration
Material Type:
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Methodology for Active Junction Profile Extraction in thin film FD-SOI Enabling performance driver identification in 500°C devices for 3D sequential integration

Frutuoso, T. Mota ; Garros, X. ; Batude, P. ; Brunet, L. ; Lacord, J. ; Sklenard, B. ; Lapras, V. ; Fenouillet-Beranger, C. ; Ribotta, M. ; Magalhaes-Lucas, A. ; Kanyandekwe, J. ; Kies, R. ; Romano, G. ; Catapano, E. ; Casse, M. ; Lugo-Alvarez, J. ; Ferrari, P. ; Gaillard, F.

2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2022, p.332-333

IEEE

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8
Development and Application of Kanban and Milk-Run in Production Process of a Metalworking Company
Development and Application of Kanban and Milk-Run in Production Process of a Metalworking Company
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Development and Application of Kanban and Milk-Run in Production Process of a Metalworking Company

Caballero-Barrera, A. F. ; Valdivia-Castillo, J. P. ; Quiroz-Flores, J.C. ; Alvarez-Merino, J. C.

2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2019, p.1250-1254

IEEE

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9
Illumination analysis of the digital pattern recognition system by Bessel masks and one-dimensional signatures
Illumination analysis of the digital pattern recognition system by Bessel masks and one-dimensional signatures
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Illumination analysis of the digital pattern recognition system by Bessel masks and one-dimensional signatures

Solorza, S ; Álvarez-Borrego, J Martins Costa, Manuel Filipe P. C

Proceedings of SPIE, the international society for optical engineering, 2013, Vol.8785, p.878573-878573-7

SPIE

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10
CERN’s Linac4 H− sources: Status and operational results
CERN’s Linac4 H− sources: Status and operational results
Material Type:
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CERN’s Linac4 H− sources: Status and operational results

Lettry, J. ; Aguglia, D. ; Andersson, P. ; Bertolo, S. ; Butterworth, A. ; Coutron, Y. ; Dallocchio, A. ; David, N. ; Chaudet, E. ; Fink, D. ; Gil-Flores, J. ; Garlasche, M. ; Grudiev, A. ; Guida, R. ; Hansen, J. ; Haase, M. ; Jones, A. ; Koszar, I. ; Machado, C. ; Mastrostefano, C.

AIP Conference Proceedings, 2015, Vol.1655 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

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