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Material Type: Artigo
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Automation, Research Technology, and Researchers’ Trajectories: Evidence from Computer Science and Electrical EngineeringFurman, Jeffrey L ; Teodoridis, FlorentaOrganization science (Providence, R.I.), 2020-03, Vol.31 (2), p.330-354 [Periódico revisado por pares]Linthicum: INFORMSTexto completo disponível |
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Material Type: Livro
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Current themes in engineering technologies : selected papers of the World Congress on Engineering and Computer Science, San Francisco, California, 24-26 October 2007World Congress on Engineering and Computer Science (2007 : San Francisco, Calif.) Sio-Iong Ao; Mahyar A Amouzegar; Su-shing ChenMelville, N.Y. : American Institute of Physics 2008Localização: IF - Instituto de Física (MS AIP v.1007 )(Acessar) |
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Material Type: Artigo
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Viewing computer science through citation analysis: Salton and Bergmark ReduxDevarakonda, Sitaram ; Korobskiy, Dmitriy ; Warnow, Tandy ; Chacko, GeorgeScientometrics, 2020-10, Vol.125 (1), p.271-287 [Periódico revisado por pares]Cham: Springer International PublishingTexto completo disponível |
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Material Type: Artigo
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AI Fairness 360: An extensible toolkit for detecting and mitigating algorithmic biasBellamy, R. K. E. ; Dey, K. ; Hind, M. ; Hoffman, S. C. ; Houde, S. ; Kannan, K. ; Lohia, P. ; Martino, J. ; Mehta, S. ; Mojsilovic, A. ; Nagar, S. ; Ramamurthy, K. Natesan ; Richards, J. ; Saha, D. ; Sattigeri, P. ; Singh, M. ; Varshney, K. R. ; Zhang, Y.IBM journal of research and development, 2019-07, Vol.63 (4/5), p.4-4:15 [Periódico revisado por pares]Texto completo disponível |
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Material Type: Artigo
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Does double‐blind peer review reduce bias? Evidence from a top computer science conferenceSun, Mengyi ; Barry Danfa, Jainabou ; Teplitskiy, MishaJournal of the American Society for Information Science and Technology, 2022-06, Vol.73 (6), p.811-819 [Periódico revisado por pares]Hoboken, USA: John Wiley & Sons, IncTexto completo disponível |
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Material Type: Artigo
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Using Scopus’s CiteScore for assessing the quality of computer science conferencesMeho, Lokman I.Journal of informetrics, 2019-02, Vol.13 (1), p.419-433 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
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Material Type: Livro
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Data Clustering: Algorithms and ApplicationsAggarwal, Charu C ; Reddy, Chandan K Reddy, Chandan K. ; Aggarwal, Charu C.Milton: CRC Press 2014Texto completo disponível |
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Material Type: Livro
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Dictionary of computer science, engineering, and technologyPhillip A Laplante edBoca Raton, Flor. CRC Press c2001Localização: ICMC - Inst. Ciên. Mat. Computação (R D554 e.1 )(Acessar) |
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Material Type: Artigo
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Author‐based analysis of conference versus journal publication in computer scienceKim, JinseokJournal of the American Society for Information Science and Technology, 2019-01, Vol.70 (1), p.71-82 [Periódico revisado por pares]Hoboken: Wiley Periodicals IncTexto completo disponível |
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Material Type: Artigo
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A survey of safety and trustworthiness of deep neural networks: Verification, testing, adversarial attack and defence, and interpretabilityHuang, Xiaowei ; Kroening, Daniel ; Ruan, Wenjie ; Sharp, James ; Sun, Youcheng ; Thamo, Emese ; Wu, Min ; Yi, XinpingComputer science review, 2020-08, Vol.37, p.100270, Article 100270Elsevier IncTexto completo disponível |