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API Message-Driven Regression Testing Framework
API Message-Driven Regression Testing Framework
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API Message-Driven Regression Testing Framework

Demircioğlu, Emine Dumlu ; Kalipsiz, Oya

Electronics (Basel), 2022-09, Vol.11 (17), p.2671 [Periódico revisado por pares]

Basel: MDPI AG

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2
Real-Time and Deep Learning Based Vehicle Detection and Classification Using Pixel-Wise Code Exposure Measurements
Real-Time and Deep Learning Based Vehicle Detection and Classification Using Pixel-Wise Code Exposure Measurements
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Real-Time and Deep Learning Based Vehicle Detection and Classification Using Pixel-Wise Code Exposure Measurements

Kwan, Chiman ; Gribben, David ; Chou, Bryan ; Budavari, Bence ; Larkin, Jude ; Rangamani, Akshay ; Tran, Trac ; Zhang, Jack ; Etienne-Cummings, Ralph

Electronics (Basel), 2020-06, Vol.9 (6), p.1014 [Periódico revisado por pares]

Basel: MDPI AG

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3
Wearable Travel Aid for Environment Perception and Navigation of Visually Impaired People
Wearable Travel Aid for Environment Perception and Navigation of Visually Impaired People
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Wearable Travel Aid for Environment Perception and Navigation of Visually Impaired People

Bai, Jinqiang ; Liu, Zhaoxiang ; Lin, Yimin ; Li, Ye ; Lian, Shiguo ; Liu, Dijun

Electronics (Basel), 2019-06, Vol.8 (6), p.697 [Periódico revisado por pares]

Basel: MDPI AG

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4
Reinventing Web Security: An Enhanced Cycle-Consistent Generative Adversarial Network Approach to Intrusion Detection
Reinventing Web Security: An Enhanced Cycle-Consistent Generative Adversarial Network Approach to Intrusion Detection
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Reinventing Web Security: An Enhanced Cycle-Consistent Generative Adversarial Network Approach to Intrusion Detection

Fang, Menghao ; Wang, Yixiang ; Yang, Liangbin ; Wu, Haorui ; Yin, Zilin ; Liu, Xiang ; Xie, Zexian ; Kong, Zixiao

Electronics (Basel), 2024-05, Vol.13 (9), p.1711 [Periódico revisado por pares]

Basel: MDPI AG

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5
Source File Tracking Localization: A Fault Localization Method for Deep Learning Frameworks
Source File Tracking Localization: A Fault Localization Method for Deep Learning Frameworks
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Source File Tracking Localization: A Fault Localization Method for Deep Learning Frameworks

Ma, Zhenshu ; Yang, Bo ; Zhang, Yuhang

Electronics (Basel), 2023-11, Vol.12 (22), p.4579 [Periódico revisado por pares]

Basel: MDPI AG

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6
Development of Quantum Protocol Modification CSLOE–2022, Increasing the Cryptographic Strength of Classical Quantum Protocol BB84
Development of Quantum Protocol Modification CSLOE–2022, Increasing the Cryptographic Strength of Classical Quantum Protocol BB84
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Development of Quantum Protocol Modification CSLOE–2022, Increasing the Cryptographic Strength of Classical Quantum Protocol BB84

Cherckesova, Larissa V. ; Safaryan, Olga A. ; Beskopylny, Alexey N. ; Revyakina, Elena

Electronics (Basel), 2022-12, Vol.11 (23), p.3954 [Periódico revisado por pares]

Basel: MDPI AG

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7
The Pilot Study of the Hazard Perception Test for Evaluation of the Driver’s Skill Using Virtual Reality
The Pilot Study of the Hazard Perception Test for Evaluation of the Driver’s Skill Using Virtual Reality
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The Pilot Study of the Hazard Perception Test for Evaluation of the Driver’s Skill Using Virtual Reality

Sawada, Tatsunori ; Uda, Hiroki ; Suzuki, Akira ; Tomori, Kounosuke ; Ohno, Kanta ; Iga, Hiroki ; Okita, Yuho ; Fujita, Yoshio

Electronics (Basel), 2021-05, Vol.10 (9), p.1114 [Periódico revisado por pares]

Basel: MDPI AG

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8
FPSNET: An Architecture for Neural-Network-Based Feature Point Extraction for SLAM
FPSNET: An Architecture for Neural-Network-Based Feature Point Extraction for SLAM
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FPSNET: An Architecture for Neural-Network-Based Feature Point Extraction for SLAM

Farrukh, Fasih Ud Din ; Zhang, Weiyi ; Zhang, Chun ; Wang, Zhihua ; Jiang, Hanjun

Electronics (Basel), 2022-12, Vol.11 (24), p.4168 [Periódico revisado por pares]

Basel: MDPI AG

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9
All-in-One Wafer-Level Solution for MMIC Automatic Testing
All-in-One Wafer-Level Solution for MMIC Automatic Testing
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All-in-One Wafer-Level Solution for MMIC Automatic Testing

Ding, Xu ; Wang, Zhiyu ; Liu, Jiarui ; Zhou, Min ; Chen, Wei ; Chen, Hua ; Mo, Jiongjiong ; Yu, Faxin

Electronics (Basel), 2018-05, Vol.7 (5), p.57 [Periódico revisado por pares]

Basel: MDPI AG

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10
BookGPT: A General Framework for Book Recommendation Empowered by Large Language Model
BookGPT: A General Framework for Book Recommendation Empowered by Large Language Model
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BookGPT: A General Framework for Book Recommendation Empowered by Large Language Model

Li, Zhiyu ; Chen, Yanfang ; Zhang, Xuan ; Liang, Xun

Electronics (Basel), 2023-11, Vol.12 (22), p.4654 [Periódico revisado por pares]

Basel: MDPI AG

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