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Refinado por: assunto: Optics remover
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1
Measurement of reaction-in-flight neutrons using thulium activation at the National Ignition Facility
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Ata de Congresso
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Measurement of reaction-in-flight neutrons using thulium activation at the National Ignition Facility

Grim, G. P ; Rundberg, R ; Fowler, M. M ; Hayes, A. C ; Jungman, G ; Boswell, M ; Klein, A ; Wilhelmy, J ; Tonchev, A ; Yeamans, C. B Bell, Perry M ; Grim, Gary P

SPIE 2014

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2
Evidence of surface plasmon resonance in ultrafast laser-induced ripples
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Artigo
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Evidence of surface plasmon resonance in ultrafast laser-induced ripples

Garrelie, F ; Colombier, J-P ; Pigeon, F ; Tonchev, S ; Faure, N ; Bounhalli, M ; Reynaud, S ; Parriaux, O

Optics express, 2011-05, Vol.19 (10), p.9035-9043 [Periódico revisado por pares]

United States: Optical Society of America - OSA Publishing

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3
Microchip-laser polarization control by destructive-interference resonant-grating mirror
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Artigo
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Microchip-laser polarization control by destructive-interference resonant-grating mirror

Pigeon, F ; Pommier, J C ; Reynaud, S ; Parriaux, O ; Abdou Ahmed, M ; Tonchev, S ; Landru, N ; Fève, J P

Optics express, 2007-03, Vol.15 (5), p.2573-2584 [Periódico revisado por pares]

United States: Optical Society of America - OSA Publishing

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4
Low-loss wavelength tuning of a mid-infrared Cr2+:ZnSe laser using a Littrow-mounted resonant diffraction grating
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Artigo
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Low-loss wavelength tuning of a mid-infrared Cr2+:ZnSe laser using a Littrow-mounted resonant diffraction grating

Vermeulen, N. ; Wasylczyk, P. ; Tonchev, S. ; Muys, P. ; Ottevaere, H. ; Parriaux, O. ; Thienpont, H.

Laser physics letters, 2011-08, Vol.8 (8), p.606-612 [Periódico revisado por pares]

Berlin: WILEY-VCH Verlag

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5
Efficient and tolerant resonant grating coupler for multimode optical interconnections
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Artigo
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Efficient and tolerant resonant grating coupler for multimode optical interconnections

Destouches, N ; Blanc, D ; Franc, J ; Tonchev, S ; Hendrickx, N ; Van Daele, P ; Parriaux, O

Optics express, 2007-12, Vol.15 (25), p.16870-16879 [Periódico revisado por pares]

United States: Optical Society of America - OSA Publishing

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6
100 nm period grating by high-index phase-mask immersion lithography
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Artigo
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100 nm period grating by high-index phase-mask immersion lithography

Bourgin, Yannick ; Jourlin, Yves ; Parriaux, Olivier ; Talneau, Anne ; Tonchev, Svetlen ; Veillas, Colette ; Karvinen, Petri ; Passilly, Nicolas ; Md Zain, Ahmad R ; De La Rue, Richard M ; Van Erps, Jürgen ; Troadec, David

Optics express, 2010-05, Vol.18 (10), p.10557-10566 [Periódico revisado por pares]

United States: Optical Society of America - OSA Publishing

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7
High-performance wavelength tuning of a mid-infrared solid-state laser using a resonant diffraction grating
Material Type:
Ata de Congresso
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High-performance wavelength tuning of a mid-infrared solid-state laser using a resonant diffraction grating

Vermeulen, N ; Wasylczyk, P ; Tonchev, S ; Muys, P ; Ottevaere, H ; Parriaux, O ; Thienpont, H

SPIE 2012

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8
High-efficiency diffraction grating coupler for multimode optical interconnect
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High-efficiency diffraction grating coupler for multimode optical interconnect

Franc, Janyce ; Destouches, Nathalie ; Blanc, Danièle ; Pommier, Jean-Claude ; Tonchev, Svetlen ; Van Steenberge, Geert ; Hendrickx, Nina ; Last, Arndt ; Parriaux, Olivier

Proc. SPIE, 2006, Vol.6185, p.61851F-61851F-7

SPIE

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9
Characterization of the optical parameters of high aspect ratio polymer micro-optical components
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Characterization of the optical parameters of high aspect ratio polymer micro-optical components

Krajewski, Rafal ; Van Erps, Jurgen ; Wissmann, Markus ; Kujawinska, Malgorzata ; Parriaux, Olivier ; Tonchev, S ; Mohr, Jurgen ; Thienpont, Hugo

Proceedings of SPIE, the International Society for Optical Engineering, 2008, Vol.6992, p.69921B-69921B-11

Bellingham, Wash: SPIE

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10
Replication of micro-optical components and nano-structures for mass production
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Replication of micro-optical components and nano-structures for mass production

Wissmann, M ; Guttmann, M ; Mohr, J ; Hartmann, M ; Wilson, S ; Moran-Iglesias, C.-J ; Van Erps, J ; Krajewski, R ; Parriaux, O ; Tonchev, S

Proceedings of SPIE, the International Society for Optical Engineering, 2008, Vol.6992, p.699208-699208-12

Bellingham, Wash: SPIE

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