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Physics-based multiscale damage criterion for fatigue crack prediction in aluminium alloy
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Physics-based multiscale damage criterion for fatigue crack prediction in aluminium alloy

Zhang, J. ; Johnston, J. ; Chattopadhyay, A.

Fatigue & fracture of engineering materials & structures, 2014-02, Vol.37 (2), p.119-131 [Periódico revisado por pares]

Oxford: Blackwell Publishing Ltd

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2
n-Channel MOSFETs Fabricated on SiGe Dots for Strain-Enhanced Mobility
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n-Channel MOSFETs Fabricated on SiGe Dots for Strain-Enhanced Mobility

Jovanović, V ; Biasotto, C ; Nanver, L K ; Moers, J ; Grützmacher, D ; Gerharz, J ; Mussler, G ; van der Cingel, J ; Zhang, J J ; Bauer, G ; Schmidt, O G ; Miglio, L

IEEE electron device letters, 2010-10, Vol.31 (10), p.1083-1085 [Periódico revisado por pares]

New York, NY: IEEE

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3
Defects and instabilities in Hf-dielectric/SiON stacks (Invited Paper)
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Defects and instabilities in Hf-dielectric/SiON stacks (Invited Paper)

Zhang, J.F.

Microelectronic engineering, 2009-07, Vol.86 (7), p.1883-1887 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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4
A precise integration method for solving coupled vehicle–track dynamics with nonlinear wheel–rail contact
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A precise integration method for solving coupled vehicle–track dynamics with nonlinear wheel–rail contact

Zhang, J. ; Gao, Q. ; Tan, S.J. ; Zhong, W.X.

Journal of sound and vibration, 2012-10, Vol.331 (21), p.4763-4773 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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5
Study of proton irradiation effects on AlGaN/GaN high electron mobility transistors
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Study of proton irradiation effects on AlGaN/GaN high electron mobility transistors

Lv, Ling ; Ma, J.G. ; Cao, Y.R. ; Zhang, J.C. ; Zhang, W. ; Li, L. ; Xu, S.R. ; Ma, X.H. ; Ren, X.T. ; Hao, Y.

Microelectronics and reliability, 2011-12, Vol.51 (12), p.2168-2172 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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6
Factory and Field Tests of a 220 kV/300 MVA Statured Iron-Core Superconducting Fault Current Limiter
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Factory and Field Tests of a 220 kV/300 MVA Statured Iron-Core Superconducting Fault Current Limiter

Xin, Y. ; Gong, W. Z. ; Sun, Y. W. ; Cui, J. B. ; Hong, H. ; Niu, X. Y. ; Wang, H. Z. ; Wang, L. Z. ; Li, Q. ; Zhang, J. Y. ; Wei, Z. Q. ; Liu, L. ; Yang, H. ; Zhu, X. H.

IEEE transactions on applied superconductivity, 2013-06, Vol.23 (3), p.5602305-5602305 [Periódico revisado por pares]

New York, NY: IEEE

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7
Reynolds-Averaged Navier-Stokes Simulation of the Flow and Tracer Transport in a Multichambered Ozone Contactor
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Reynolds-Averaged Navier-Stokes Simulation of the Flow and Tracer Transport in a Multichambered Ozone Contactor

Zhang, J ; Tejada-Martínez, A. E ; Zhang, Q

Journal of environmental engineering (New York, N.Y.), 2013-03, Vol.139 (3), p.450-454 [Periódico revisado por pares]

Reston, VA: American Society of Civil Engineers

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8
Turbine Nozzle Endwall Film Cooling Study Using Pressure-Sensitive Paint
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Turbine Nozzle Endwall Film Cooling Study Using Pressure-Sensitive Paint

Zhang, Luzeng J ; Jaiswal, Ruchira Sharma

Journal of turbomachinery, 2001-10, Vol.123 (4), p.730-738 [Periódico revisado por pares]

New York, NY: ASME

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9
Observation of the Ambient Effect in BTI Characteristics of Back-Gated Single Layer Graphene Field Effect Transistors
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Observation of the Ambient Effect in BTI Characteristics of Back-Gated Single Layer Graphene Field Effect Transistors

Wen Jun Liu ; Xiao Wei Sun ; Xuan Anh Tran ; Zheng Fang ; Zhong Rui Wang ; Fei Wang ; Ling Wu ; Zhang, J. F. ; Jun Wei ; Hui Long Zhu ; Hong Yu Yu

IEEE transactions on electron devices, 2013-08, Vol.60 (8), p.2682-2686 [Periódico revisado por pares]

New York, NY: IEEE

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10
Simulation of the flow over axisymmetric submarine hulls in steady turning
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Simulation of the flow over axisymmetric submarine hulls in steady turning

Zhang, J.T. ; Maxwell, Jordan A. ; Gerber, Andrew G. ; Holloway, A. Gordon L. ; Watt, George D.

Ocean engineering, 2013-01, Vol.57, p.180-196 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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