skip to main content
Idioma:
Refinado por: Base de dados/Biblioteca: Science Citation Index Expanded (Web of Science) remover idioma: Japonês remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features
The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features
Material Type:
Artigo 		Adicionar ao Meu Espaço

The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features

Santos, Sergio ; Barcons, Victor ; Christenson, Hugo K ; Font, Josep ; Thomson, Neil H Gruverman, Alexei

PloS one, 2011-08, Vol.6 (8), p.e23821 [Periódico revisado por pares]

United States: Public Library of Science

Texto completo disponível

Citações Citado por
2
Subharmonic excitation in amplitude modulation atomic force microscopy in the presence of adsorbed water layers
Subharmonic excitation in amplitude modulation atomic force microscopy in the presence of adsorbed water layers
Material Type:
Artigo 		Adicionar ao Meu Espaço

Subharmonic excitation in amplitude modulation atomic force microscopy in the presence of adsorbed water layers

Santos, Sergio ; Barcons, Victor ; Verdaguer, Albert ; Chiesa, Matteo

Journal of applied physics, 2011-12, Vol.110 (11), p.114902-114902-10 [Periódico revisado por pares]

United States: American Institute of Physics

Texto completo disponível

Citações Citado por

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.