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Refinado por: Base de dados/Biblioteca: BACON - Mir@bel - GLOBAL_LIBRESACCES remover Base de dados/Biblioteca: ROAD: Directory of Open Access Scholarly Resources remover
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1
The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features
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The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features

Santos, Sergio ; Barcons, Victor ; Christenson, Hugo K ; Font, Josep ; Thomson, Neil H Gruverman, Alexei

PloS one, 2011-08, Vol.6 (8), p.e23821 [Periódico revisado por pares]

United States: Public Library of Science

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2
Quantification of dissipation and deformation in ambient atomic force microscopy
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Quantification of dissipation and deformation in ambient atomic force microscopy

Santos, Sergio ; Gadelrab, Karim R ; Barcons, Victor ; Stefancich, Marco ; Chiesa, Matteo

New journal of physics, 2012-07, Vol.14 (7), p.73044 [Periódico revisado por pares]

IOP Publishing

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3
Unlocking higher harmonics in atomic force microscopy with gentle interactions
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Unlocking higher harmonics in atomic force microscopy with gentle interactions

Santos, Sergio ; Barcons, Victor ; Font, Josep ; Verdaguer, Albert

Beilstein journal of nanotechnology, 2014-03, Vol.5 (1), p.268-277 [Periódico revisado por pares]

Germany: Beilstein-Institut

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