skip to main content
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Quantitative cell motility for in vitro wound healing using level set-based active contour tracking
Material Type:
Artigo
Adicionar ao Meu Espaço

Quantitative cell motility for in vitro wound healing using level set-based active contour tracking

Bunyak, F. ; Palaniappan, K. ; Nath, S.K. ; Baskin, T.L. ; Gang Dong

2006 3rd IEEE International Symposium on Biomedical Imaging--Macro to Nano : Arlington, WA, 6-9 April 2006, 2006-04, Vol.3, p.1040-1043

IEEE

Texto completo disponível

2
von Mises-Fisher mixture model of the diffusion ODF
Material Type:
Artigo
Adicionar ao Meu Espaço

von Mises-Fisher mixture model of the diffusion ODF

McGraw, T. ; Vemuri, B.C. ; Yezierski, B. ; Mareci, T.

2006 3rd IEEE International Symposium on Biomedical Imaging--Macro to Nano : Arlington, WA, 6-9 April 2006, 2006, Vol.3, p.65-68

IEEE

Texto completo disponível

3
Optimal multi-channel time-sequential acquisition in dynamic MRI with parallel coils
Material Type:
Artigo
Adicionar ao Meu Espaço

Optimal multi-channel time-sequential acquisition in dynamic MRI with parallel coils

Sharif, B. ; Bresler, Y.

2006 3rd IEEE International Symposium on Biomedical Imaging--Macro to Nano : Arlington, WA, 6-9 April 2006, 2006, Vol.3, p.45-48

IEEE

Texto completo disponível

4
Brain shape characterization from deformation
Material Type:
Artigo
Adicionar ao Meu Espaço

Brain shape characterization from deformation

Staib, L.H. ; Jackowski, M. ; Papademetris, X.

2006 3rd IEEE International Symposium on Biomedical Imaging--Macro to Nano : Arlington, WA, 6-9 April 2006, 2006, Vol.3, p.1140-1143

IEEE

Texto completo disponível

5
Landmark matching on the sphere using distance functions
Material Type:
Artigo
Adicionar ao Meu Espaço

Landmark matching on the sphere using distance functions

Lepore, N. ; Leow, A. ; Thompson, P.

2006 3rd IEEE International Symposium on Biomedical Imaging--Macro to Nano : Arlington, WA, 6-9 April 2006, 2006-04, Vol.3, p.450-453

IEEE

Texto completo disponível

Buscando em bases de dados remotas. Favor aguardar.