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Resultados de 1 a 10 de 15  para Produção Intelectual da USP

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Refinado por: Nome da Publicação: Microelectronics Technology and Devices SBMICRO 2005 remover
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1
A study of total series resistance and effective channel length comparing SOI nMOSFET and GC SOI nMOSFET in saturation region
A study of total series resistance and effective channel length comparing SOI nMOSFET and GC SOI nMOSFET in saturation region
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

A study of total series resistance and effective channel length comparing SOI nMOSFET and GC SOI nMOSFET in saturation region

Galba Falce de Almeida João Antonio Martino 1959-; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

2
Temperature influences on the drain leakage current behavior in graded-channel SOI nMOSFETs
Temperature influences on the drain leakage current behavior in graded-channel SOI nMOSFETs
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Temperature influences on the drain leakage current behavior in graded-channel SOI nMOSFETs

Marcello Bellodi João Antonio Martino 1959-; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

3
Determination of the ion density and electron temperature using a planar electrostatic probe
Determination of the ion density and electron temperature using a planar electrostatic probe
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Determination of the ion density and electron temperature using a planar electrostatic probe

Laura Swart Patrick Bernard Verdonck 1958-; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

4
SU-8 low contrast process for multi-level e-beam lithography
SU-8 low contrast process for multi-level e-beam lithography
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

SU-8 low contrast process for multi-level e-beam lithography

R Catelli Antonio Carlos Seabra 1961-; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

5
A simple method to model nonrectangular-gate layout in SOI MOSFETs
A simple method to model nonrectangular-gate layout in SOI MOSFETs
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

A simple method to model nonrectangular-gate layout in SOI MOSFETs

Renato Camargo Giacomini João Antonio Martino 1959-; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

6
Temperature and oxide thickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs
Temperature and oxide thickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Temperature and oxide thickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs

Milene Galeti João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington: The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

7
Potential of improved gain in operational transconductance amplifier using 0,5 Mm graded-channel SOI nMOSFET for applications in the gigahertz range
Potential of improved gain in operational transconductance amplifier using 0,5 Mm graded-channel SOI nMOSFET for applications in the gigahertz range
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Potential of improved gain in operational transconductance amplifier using 0,5 Mm graded-channel SOI nMOSFET for applications in the gigahertz range

Salvador Pinillos Gimenez Marcelo Antonio Pavanello; João Antonio Martino 1959-; Denis Flandre; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

8
Analysis of the linear kink effect in partially depleted SOI nMOSFETs
Analysis of the linear kink effect in partially depleted SOI nMOSFETs
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Analysis of the linear kink effect in partially depleted SOI nMOSFETs

Paula Ghedini Der Agopian João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

9
Influence of the gate oxide tunneling effect on the extraction of the silicon film and front oxide thickness in SOI nMOSFET
Influence of the gate oxide tunneling effect on the extraction of the silicon film and front oxide thickness in SOI nMOSFET
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Influence of the gate oxide tunneling effect on the extraction of the silicon film and front oxide thickness in SOI nMOSFET

A.G. Paiola Aparecido Sirley Nicolett; João Antonio Martino 1959-; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

10
Integrated optical chemical sensor fabricated on silicon substrate
Integrated optical chemical sensor fabricated on silicon substrate
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Integrated optical chemical sensor fabricated on silicon substrate

Acácio Luiz Siarkowski Nilton Itiro Morimoto 1962-; Maurício da Silva Baptista; Ben-Hur Viana Borges; International Symposium on Microelectronics Technology and Devices SBMICRO (20. 2005 Florianópolis)

Claeys, C.; Swart, J. W.; Morimoto, N. I.; Verdonck, P., eds. Microelectronics Technology and Devices SBMICRO 2005 Pennington : The Electrochemical Society, 2005. Proceedings v. 2005-08

Pennington The Electrochemical Society 2005

Item não circula. Consulte sua biblioteca.(Acessar)

Resultados de 1 a 10 de 15  para Produção Intelectual da USP

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Deste Autor:

  1. International Symposium on Microelectronics Technology and Devices SBMICRO
  2. Martino, J
  3. Pavanello, M
  4. Simoen, E
  5. Claeys, C

Neste Assunto:

  1. Microeletrônica

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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