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Refinado por: Nome da Publicação: EUROSOI 2013 remover
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1
Influence of interface trap density on vertical NW-TFETs with different source composition
Influence of interface trap density on vertical NW-TFETs with different source composition
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Influence of interface trap density on vertical NW-TFETs with different source composition

João Antonio Martino 1959- Felipe Neves Souza; Paula Ghedini Der Agopian; Rita Rooyackers; A Vandooren; Eddy Simoen; Cor Claeys; European Workshop on Silicon on Insulator Technology, Devices and Circuits 2013 Paris, France) (9.

Anais EUROSOI 2013 Paris, 2013

Paris Institut Superieur d'Électronique 2013

Item não circula. Consulte sua biblioteca.(Acessar)

2
Improvement of Retention Time Using Pulsed Back Gate Bias on UTBOX SOI Memory Cell
Improvement of Retention Time Using Pulsed Back Gate Bias on UTBOX SOI Memory Cell
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Improvement of Retention Time Using Pulsed Back Gate Bias on UTBOX SOI Memory Cell

João Antonio Martino 1959- Katia Regina Akemi Sasaki; Albert Nissimoff; Luciano Mendes Almeida; Marc Aoulaiche; Eddy Simoen; Cor Claeys; European Workshop on Silicon on Insulator Technology, Devices and Circuits 2013 Paris, France) (9.

Anais EUROSOI 2013 Paris, 2013

Paris Institut Superieur d'Électronique 2013

Item não circula. Consulte sua biblioteca.(Acessar)

3
Experimental and Simulation of 1T-DRAM Trend with the Gate Length on UTBOX Devices
Experimental and Simulation of 1T-DRAM Trend with the Gate Length on UTBOX Devices
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Experimental and Simulation of 1T-DRAM Trend with the Gate Length on UTBOX Devices

João Antonio Martino 1959- Talitha Nicoletti; Katia Regina Akemi Sasaki; Marc Aoulaiche; Eddy Simoen; Cor Claeys; European Workshop on Silicon on Insulator Technology, Devices and Circuits 2013 Paris, France) (9.

Anais EUROSOI 2013 Paris, 2013

Paris Institut Superieur d'Électronique 2013

Item não circula. Consulte sua biblioteca.(Acessar)

4
Experimental comparison between tensile and compressive uniaxially stressed MuGFETs under X-ray radiation
Experimental comparison between tensile and compressive uniaxially stressed MuGFETs under X-ray radiation
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Experimental comparison between tensile and compressive uniaxially stressed MuGFETs under X-ray radiation

João Antonio Martino 1959- Paula Ghedini Der Agopian; V. V Peruzzi; Salvador Pinillos Gimenez; M. A. G Silveira; Eddy Simoen; Cor Claeys; European Workshop on Silicon on Insulator Technology, Devices and Circuits (9th 2013 Paris, France)

Anais EUROSOI 2013 Paris, 2013

Paris Institut Superieur d'Électronique 2013

Item não circula. Consulte sua biblioteca.(Acessar)

5
Low frequency noise assessment in advanced UTBOX SOI n-channel MOSFETs
Low frequency noise assessment in advanced UTBOX SOI n-channel MOSFETs
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Low frequency noise assessment in advanced UTBOX SOI n-channel MOSFETs

João Antonio Martino 1959- V Strobel; B Cretu; Sara Dereste dos Santos; Eddy Simoen; J.-M Routure; R Carin; Marc Aoulaiche; Cor Claeys; European Workshop on Silicon on Insulator Technology, Devices and Circuits 2013 Paris, France) (9.

Anais EUROSOI 2013 Paris, 2013

Paris Institut Superieur d'Électronique 2013

Item não circula. Consulte sua biblioteca.(Acessar)

6
Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs
Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs

João Antonio Martino 1959- Sara Dereste dos Santos; Eddy Simoen; V Strobe; B Cretu; J.-M Routoure; R Carin; Marc Aoulaiche; Anabela Veloso; Cor Claeys; European Workshop on Silicon on Insulator Technology, Devices and Circuits (9. 2013 Paris, France)

Anais EUROSOI 2013 Paris, 2013

Paris Institut Superieur d'Électronique 2013

Item não circula. Consulte sua biblioteca.(Acessar)

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Deste Autor:

  1. Martino, J
  2. Simoen, E
  3. Claeys, C
  4. European Workshop on Silicon on Insulator Technology, D
  5. Aoulaiche, M

Neste Assunto:

  1. Microeletrônica (Congressos)
  2. Microeletrônica

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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