Physical characterization and reliability aspects of MuGFETs
Cor Claeys Eddy Simoen; J.M Rafi; Marcelo Antonio Pavanello; João Antonio Martino 1959-; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
Gerson dos Santos Fernando Josepetti Fonseca 1959-; Adnei Melges de Andrade 1943-; S.S Braga; A.C Coelho; I.S Gonçalves; W Simões; Luiz Fernando Ribeiro Pereira; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
Silicon microtips arrays fabricated by HI-PS technique for application in field emission devices
Michel Oliveira da Silva Dantas Maycon Max Kopelvski; Elisabete Galeazzo 1964-; Henrique Estanislau Maldonado Peres; Francisco Javier Ramírez Fernandez 1944-; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
Dynamic scaling of the surface roughness during electroless Cu plating onto Si in aqueous fluoride solution
Giuliano Gozzi Sebastião Gomes dos Santos Filho 1962-; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
Study of nickel silicide as mask for alkaline solutions to V-grooves fabrication
Amanda Rossi Mascaro Lucas Gonçalves Dias Gonçalves; Nilton Itiro Morimoto 1962-; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
Characterization of a ISFET device as a ph sensor for applications in the industrial, environmental and biomedical fields
Robson Scaff Marcelo Bariatto Andrade Fontes; Sebastião Gomes dos Santos Filho 1962-; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
Silicon microtips with self-aligned integrated electrodes
A.L. Barros Alexandre Tavares Lopes; Marcelo Nelson Paez Carreño 1962-; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
Advanced ESD protection solutions in CMOS/BiCMOS technologies
Juin J Liou Walter Jaimes Salcedo 1961-; Zhiwei Liu; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
Electroless deposition of CuNiP alloys onto silicon surfaces
Fernando Trevisan Saez Parra Sebastião Gomes dos Santos Filho 1962-; Angelo Eduardo Battistini Marques; Sandro Martini; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)
Triple gate finFET parameter extraction using high frequency capacitance - voltage curves
Michele Rodrigues Victor Sonnenberg; João Antonio Martino 1959-; International Symposium on Microelectronics Technology and Devices SBMICRO (22. (2007 Rio de Janeiro, RJ); Symposium on Integrated Circuits and Systems Design (20. 2007 Rio de Janeiro, RJ); Microelectronics Students Forum (7. 2007 Rio de Janeiro, RJ)