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Pseudo-Response Regulator is misexpressed in the photoperiod insensitive Ppd-D1a mutant of wheat (Triticum aestivum L.)Beales, James ; Turner, Adrian ; Griffiths, Simon ; Snape, John W ; Laurie, David ATheoretical and applied genetics, 2007-09, Vol.115 (5), p.721-733 [Periódico revisado por pares]Heidelberg: Berlin/Heidelberg : Springer-VerlagTexto completo disponível |
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Material Type: Artigo
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Heat and drought adaptive QTL in a wheat population designed to minimize confounding agronomic effectsPinto, R. Suzuky ; Reynolds, Matthew P ; Mathews, Ky L ; McIntyre, C. Lynne ; Olivares-Villegas, Juan-Jose ; Chapman, Scott CTheoretical and applied genetics, 2010-10, Vol.121 (6), p.1001-1021 [Periódico revisado por pares]Berlin/Heidelberg: Berlin/Heidelberg : Springer-VerlagTexto completo disponível |
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Genome-based prediction of testcross values in maizeAlbrecht, Theresa ; Wimmer, Valentin ; Auinger, Hans-Jürgen ; Erbe, Malena ; Knaak, Carsten ; Ouzunova, Milena ; Simianer, Henner ; Schön, Chris-CarolinTheoretical and applied genetics, 2011-07, Vol.123 (2), p.339-350 [Periódico revisado por pares]Berlin/Heidelberg: Springer-VerlagTexto completo disponível |
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Accuracy of genotypic value predictions for marker-based selection in biparental plant populationsLorenzana, Robenzon E ; Bernardo, RexTheoretical and applied genetics, 2009-12, Vol.120 (1), p.151-161 [Periódico revisado por pares]Berlin/Heidelberg: Berlin/Heidelberg : Springer-VerlagTexto completo disponível |
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Identification and development of a functional marker of TaGW2 associated with grain weight in bread wheat (Triticum aestivum L.)Su, Zhenqi ; Hao, Chenyang ; Wang, Lanfen ; Dong, Yuchen ; Zhang, XueyongTheoretical and applied genetics, 2011-01, Vol.122 (1), p.211-223 [Periódico revisado por pares]Berlin/Heidelberg: Springer-VerlagTexto completo disponível |
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Material Type: Artigo
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high-density microsatellite consensus map for bread wheat (Triticum aestivum L.)Somers, D.J ; Isaac, P ; Edwards, KTheoretical and applied genetics, 2004-10, Vol.109 (6), p.1105-1114 [Periódico revisado por pares]Heidelberg: SpringerTexto completo disponível |
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Material Type: Artigo
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High throughput analysis of grape genetic diversity as a tool for germplasm collection managementLaucou, V ; Lacombe, T ; Dechesne, F ; Siret, R ; Bruno, J.-P ; Dessup, M ; Dessup, T ; Ortigosa, P ; Parra, P ; Roux, C ; Santoni, S ; Varès, D ; Péros, J.-P ; Boursiquot, J.-M ; This, PTheoretical and applied genetics, 2011-04, Vol.122 (6), p.1233-1245 [Periódico revisado por pares]Berlin/Heidelberg: Berlin/Heidelberg : Springer-VerlagTexto completo disponível |
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Material Type: Artigo
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Gene-specific markers for the wheat gene Lr34/Yr18/Pm38 which confers resistance to multiple fungal pathogensLagudah, Evans S ; Krattinger, Simon G ; Herrera-Foessel, Sybil ; Singh, Ravi P ; Huerta-Espino, Julio ; Spielmeyer, Wolfgang ; Brown-Guedira, Gina ; Selter, Liselotte L ; Keller, BeatTheoretical and applied genetics, 2009-09, Vol.119 (5), p.889-898 [Periódico revisado por pares]Berlin/Heidelberg: Berlin/Heidelberg : Springer-VerlagTexto completo disponível |
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Material Type: Artigo
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Diversity arrays technology (DArT) for high-throughput profiling of the hexaploid wheat genomeAkbari, Mona ; Wenzl, Peter ; Caig, Vanessa ; Carling, Jason ; Xia, Ling ; Yang, Shiying ; Uszynski, Grzegorz ; Mohler, Volker ; Lehmensiek, Anke ; Kuchel, Haydn ; Hayden, Mathew J ; Howes, Neil ; Sharp, Peter ; Vaughan, Peter ; Rathmell, Bill ; Huttner, Eric ; Kilian, AndrzejTheoretical and applied genetics, 2006-11, Vol.113 (8), p.1409-1420 [Periódico revisado por pares]Heidelberg: Berlin/Heidelberg : Springer-VerlagTexto completo disponível |
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Material Type: Artigo
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Identification and characterization of large-effect quantitative trait loci for grain yield under lowland drought stress in rice using bulk-segregant analysisVenuprasad, Ramaiah ; Dalid, C. O ; Del Valle, M ; Zhao, D ; Espiritu, M ; Sta Cruz, M. T ; Amante, M ; Kumar, A ; Atlin, G. NTheoretical and applied genetics, 2009-12, Vol.120 (1), p.177-190 [Periódico revisado por pares]Berlin/Heidelberg: Berlin/Heidelberg : Springer-VerlagTexto completo disponível |