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Refinado por: Base de dados/Biblioteca: IngentaConnect Journals remover Nome da Publicação: Nanomaterials remover Materials Research Database remover
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1
Counting Small Particles in Electron Microscopy Images—Proposal for Rules and Their Application in Practice
Counting Small Particles in Electron Microscopy Images—Proposal for Rules and Their Application in Practice
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Counting Small Particles in Electron Microscopy Images—Proposal for Rules and Their Application in Practice

Bresch, Harald ; Hodoroaba, Vasile-Dan ; Schmidt, Alexandra ; Rasmussen, Kirsten ; Rauscher, Hubert

Nanomaterials (Basel, Switzerland), 2022-06, Vol.12 (13), p.2238 [Periódico revisado por pares]

Basel: MDPI AG

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2
Nanoparticle Recognition on Scanning Probe Microscopy Images Using Computer Vision and Deep Learning
Nanoparticle Recognition on Scanning Probe Microscopy Images Using Computer Vision and Deep Learning
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Nanoparticle Recognition on Scanning Probe Microscopy Images Using Computer Vision and Deep Learning

Okunev, Alexey G. ; Mashukov, Mikhail Yu ; Nartova, Anna V. ; Matveev, Andrey V.

Nanomaterials (Basel, Switzerland), 2020-06, Vol.10 (7), p.1285 [Periódico revisado por pares]

Basel: MDPI AG

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3
Automated Prediction of Bacterial Exclusion Areas on SEM Images of Graphene-Polymer Composites
Automated Prediction of Bacterial Exclusion Areas on SEM Images of Graphene-Polymer Composites
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Automated Prediction of Bacterial Exclusion Areas on SEM Images of Graphene-Polymer Composites

Rahimi, Shadi ; Lovmar, Teo ; Aulova, Alexandra ; Pandit, Santosh ; Lovmar, Martin ; Forsberg, Sven ; Svensson, Magnus ; Kádár, Roland ; Mijakovic, Ivan

Nanomaterials (Basel, Switzerland), 2023-05, Vol.13 (10), p.1605 [Periódico revisado por pares]

Switzerland: MDPI AG

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4
Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images
Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images
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Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images

Wen, Haotian ; Luna-Romera, José María ; Riquelme, José C. ; Dwyer, Christian ; Chang, Shery L. Y.

Nanomaterials (Basel, Switzerland), 2021-10, Vol.11 (10), p.2706 [Periódico revisado por pares]

Basel: MDPI AG

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5
Synthesis, Characterizations, and 9.4 Tesla T2 MR Images of Polyacrylic Acid-Coated Terbium(III) and Holmium(III) Oxide Nanoparticles
Synthesis, Characterizations, and 9.4 Tesla T2 MR Images of Polyacrylic Acid-Coated Terbium(III) and Holmium(III) Oxide Nanoparticles
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Synthesis, Characterizations, and 9.4 Tesla T2 MR Images of Polyacrylic Acid-Coated Terbium(III) and Holmium(III) Oxide Nanoparticles

Marasini, Shanti ; Yue, Huan ; Ho, Son Long ; Park, Ji Ae ; Kim, Soyeon ; Jung, Ki-Hye ; Cha, Hyunsil ; Liu, Shuwen ; Tegafaw, Tirusew ; Ahmad, Mohammad Yaseen ; Ghazanfari, Adibehalsadat ; Chae, Kwon-Seok ; Chang, Yongmin ; Lee, Gang Ho

Nanomaterials (Basel, Switzerland), 2021-05, Vol.11 (5), p.1355 [Periódico revisado por pares]

Basel: MDPI AG

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6
A Deep Learning Approach for Molecular Classification Based on AFM Images
A Deep Learning Approach for Molecular Classification Based on AFM Images
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A Deep Learning Approach for Molecular Classification Based on AFM Images

Carracedo-Cosme, Jaime ; Romero-Muñiz, Carlos ; Pérez, Rubén

Nanomaterials (Basel, Switzerland), 2021-06, Vol.11 (7), p.1658 [Periódico revisado por pares]

Basel: MDPI AG

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7
Automated Recognition of Nanoparticles in Electron Microscopy Images of Nanoscale Palladium Catalysts
Automated Recognition of Nanoparticles in Electron Microscopy Images of Nanoscale Palladium Catalysts
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Automated Recognition of Nanoparticles in Electron Microscopy Images of Nanoscale Palladium Catalysts

Boiko, Daniil A. ; Sulimova, Valentina V. ; Kurbakov, Mikhail Yu ; Kopylov, Andrei V. ; Seredin, Oleg S. ; Cherepanova, Vera A. ; Pentsak, Evgeniy O. ; Ananikov, Valentine P.

Nanomaterials (Basel, Switzerland), 2022-11, Vol.12 (21), p.3914 [Periódico revisado por pares]

Basel: MDPI AG

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8
Improvement of Image Sticking in Liquid Crystal Display Doped with γ-Fe₂O₃ Nanoparticles
Improvement of Image Sticking in Liquid Crystal Display Doped with γ-Fe₂O₃ Nanoparticles
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Improvement of Image Sticking in Liquid Crystal Display Doped with γ-Fe₂O₃ Nanoparticles

Ye, Wenjiang ; Yuan, Rui ; Dai, Yayu ; Gao, Lin ; Pang, Ze ; Zhu, Jiliang ; Meng, Xiangshen ; He, Zhenghong ; Li, Jian ; Cai, Minglei ; Wang, Xiaoyan ; Xing, Hongyu

Nanomaterials (Basel, Switzerland), 2017-12, Vol.8 (1), p.5 [Periódico revisado por pares]

Switzerland: MDPI AG

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9
Nanoparticle Detection on SEM Images Using a Neural Network and Semi-Synthetic Training Data
Nanoparticle Detection on SEM Images Using a Neural Network and Semi-Synthetic Training Data
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Nanoparticle Detection on SEM Images Using a Neural Network and Semi-Synthetic Training Data

López Gutiérrez, Jorge David ; Abundez Barrera, Itzel Maria ; Torres Gómez, Nayely

Nanomaterials (Basel, Switzerland), 2022-05, Vol.12 (11), p.1818 [Periódico revisado por pares]

Switzerland: MDPI AG

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10
Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors
Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors
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Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors

Konvalina, Ivo ; Paták, Aleš ; Zouhar, Martin ; Müllerová, Ilona ; Fořt, Tomáš ; Unčovský, Marek ; Materna Mikmeková, Eliška

Nanomaterials (Basel, Switzerland), 2021-12, Vol.12 (1), p.71 [Periódico revisado por pares]

Switzerland: MDPI AG

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