Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
![]() |
Electro-thermal simulation of metal interconnections under high current flowBagnoli, P.E. ; Zhang, Y.Microelectronics and reliability, 2010-09, Vol.50 (9), p.1672-1677 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
2 |
Material Type: Artigo
|
![]() |
FIBER LASER HYDROPHONES AS PRESSURE SENSORSBAGNOLI, P. E ; BEVERINI, N ; CASTORINA, E ; FALCHINI, E ; FALCIAI, R ; FLAMINIO, V ; MACCIONI, E ; MORGANTI, M ; SORRENTINO, F ; STEFANI, F ; TRONO, CInternational journal of modern physics. A, Particles and fields, gravitation, cosmology, 2006-07, Vol.21 (supp01), p.102-106 [Periódico revisado por pares]World Scientific Publishing CompanyTexto completo disponível |
3 |
Material Type: Artigo
|
![]() |
Characterization of YSZ films by means of C- V measurements and TEM observationsBagnoli, P.E. ; Ciofi, C. ; Diligenti, A. ; Innamorato, A. ; Nannini, A.Thin solid films, 1995-08, Vol.264 (1), p.109-114 [Periódico revisado por pares]Lausanne: Elsevier B.VTexto completo disponível |
4 |
Material Type: Artigo
|
![]() |
Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnectionsNeri, B. ; Diligenti, A. ; Bagnoli, P.E.IEEE transactions on electron devices, 1987-11, Vol.34 (11), p.2317-2322 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
5 |
Material Type: Artigo
|
![]() |
Electromigration in Al based stripes: Low frequency noise measurements and MTF testsBagnoli, P.E. ; Ciofi, C. ; Neri, B. ; Pennelli, G.Microelectronics and reliability, 1996, Vol.36 (7), p.1045-1050 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
6 |
Material Type: Artigo
|
![]() |
Development of an erbium-doped fibre laser as a deep-sea hydrophoneBagnoli, P E ; Beverini, N ; Falciai, R ; Maccioni, E ; Morganti, M ; Sorrentino, F ; Stefani, F ; Trono, CJournal of optics. A, Pure and applied optics, 2006-07, Vol.8 (7), p.S535-S539Bristol: IOP PublishingTexto completo disponível |
7 |
Material Type: Artigo
|
![]() |
Effective acceptor profiles in chemically and plasma treated WNX/GaAs Shannon contacts from capacitance and current measurementsBAGNOLI, P. E ; PACCAGNELLA, A ; CALLEGARI, AIEEE transactions on electron devices, 1991-08, Vol.38 (8), p.1962-1964 [Periódico revisado por pares]New York, NY: Institute of Electrical and Electronics EngineersTexto completo disponível |
8 |
Material Type: Artigo
|
![]() |
A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise techniqueDiligenti, A. ; Bagnoli, P.E. ; Neri, B. ; Bea, S. ; Mantellassi, L.Solid-state electronics, 1989, Vol.32 (1), p.11-16 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
9 |
Material Type: Artigo
|
![]() |
Electrical characteristics of silicon nitride on silicon and InGaAs as a function of the insulator stoichiometryBagnoli, P.E. ; Piccirillo, A. ; Gobbi, A.L. ; Giannetti, R.Applied surface science, 1991-10, Vol.52 (1), p.45-52 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
10 |
Material Type: Artigo
|
![]() |
Silicon nitride/semiconductor interface state density as a function of the insulator stoichiometryBagnoli, P.E. ; Piccirillo, A. ; Valenti, P. ; Civale, G. ; Gobbi, A.L.Applied surface science, 1992, Vol.56, p.881-887 [Periódico revisado por pares]AMSTERDAM: Elsevier B.VTexto completo disponível |