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Refinado por: Base de dados/Biblioteca: Environmental Engineering Abstracts remover Nome da Publicação: Ieee Transactions On Nuclear Science remover
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1
Quantum Dot-Organic Polymer Composite Materials for Radiation Detection and Imaging
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Quantum Dot-Organic Polymer Composite Materials for Radiation Detection and Imaging

Lawrence, W. G. ; Thacker, S. ; Palamakumbura, S. ; Riley, K. J. ; Nagarkar, V. V.

IEEE transactions on nuclear science, 2012-02, Vol.59 (1), p.215-221 [Periódico revisado por pares]

New York: IEEE

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2
Non-Proportionality of Electron Response and Energy Resolution of Compton Electrons in Scintillators
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Non-Proportionality of Electron Response and Energy Resolution of Compton Electrons in Scintillators

Swiderski, L. ; Marcinkowski, R. ; Szawlowski, M. ; Moszynski, M. ; Czarnacki, W. ; Syntfeld-Kazuch, A. ; Szczesniak, T. ; Pausch, G. ; Plettner, C. ; Roemer, K.

IEEE transactions on nuclear science, 2012-02, Vol.59 (1), p.222-229 [Periódico revisado por pares]

New York: IEEE

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3
Principal Component Analysis of Gamma-Ray Spectra for Radiation Portal Monitors
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Principal Component Analysis of Gamma-Ray Spectra for Radiation Portal Monitors

Boardman, D. ; Reinhard, M. ; Flynn, A.

IEEE transactions on nuclear science, 2012-02, Vol.59 (1), p.154-160 [Periódico revisado por pares]

New York: IEEE

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4
A High-Rate Energy-Resolving Photon-Counting ASIC for Spectral Computed Tomography
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A High-Rate Energy-Resolving Photon-Counting ASIC for Spectral Computed Tomography

Gustavsson, Mikael ; Amin, Farooq Ul ; Bjorklid, Anders ; Ehliar, Andreas ; Xu, Cheng ; Svensson, Christer

IEEE transactions on nuclear science, 2012-02, Vol.59 (1), p.30-39 [Periódico revisado por pares]

New York: IEEE

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5
Optimum Design of DACs for Threshold Correction in Multichannel Processors for Radiation Detectors
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Optimum Design of DACs for Threshold Correction in Multichannel Processors for Radiation Detectors

Ratti, L. ; Manazza, A.

IEEE transactions on nuclear science, 2012-02, Vol.59 (1), p.144-153 [Periódico revisado por pares]

New York: IEEE

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6
Response Measurement of a Bonner Sphere Spectrometer for High-Energy Neutrons
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Response Measurement of a Bonner Sphere Spectrometer for High-Energy Neutrons

Masuda, A. ; Matsumoto, T. ; Harano, H. ; Nishiyama, J. ; Iwamoto, Y. ; Hagiwara, M. ; Satoh, D. ; Iwase, H. ; Yashima, H. ; Nakamura, T. ; Sato, T. ; Itoga, T. ; Nakane, Y. ; Nakashima, H. ; Sakamoto, Y. ; Theis, C. ; Feldbaumer, E. ; Jaegerhofer, L. ; Pioch, C. ; Mares, V. ; Tamii, A. ; Hatanaka, K.

IEEE transactions on nuclear science, 2012-02, Vol.59 (1), p.161-166 [Periódico revisado por pares]

New York: IEEE

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7
An Ultrasonic Scanning Technique for In-Situ `Bowing' Measurement of Prototype Fast Breeder Reactor Fuel Sub-Assembly
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An Ultrasonic Scanning Technique for In-Situ `Bowing' Measurement of Prototype Fast Breeder Reactor Fuel Sub-Assembly

Swaminathan, K. ; Asokane, C. ; Sylvia, J. I. ; Kalyanasundaram, P. ; Swaminathan, P.

IEEE transactions on nuclear science, 2012-02, Vol.59 (1), p.174-181 [Periódico revisado por pares]

New York: IEEE

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8
Properties of CdTe(Cl) crystal used for radiation detector
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Properties of CdTe(Cl) crystal used for radiation detector

Shoji, T. ; Ohba, K. ; Onabe, H. ; Suehiro, T. ; Hiratate, Y.

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1993-08, Vol.40 (4), p.405-408 [Periódico revisado por pares]

New York, NY: IEEE

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9
Nuclear power plant performance study by using neural networks
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Nuclear power plant performance study by using neural networks

Guo, Z. ; Uhrig, R.E.

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1992-08, Vol.39 (4), p.915-918 [Periódico revisado por pares]

NEW YORK: IEEE

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10
Application of neural networks to multiple alarm processing and diagnosis in nuclear power plants
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Application of neural networks to multiple alarm processing and diagnosis in nuclear power plants

Cheon, Se Woo ; Chang, Soon Heung ; Chung, Hak Yeong ; Bien, Zeung Nam

IEEE transactions on nuclear science, 1993-02, Vol.40 (1), p.11-20 [Periódico revisado por pares]

New York, NY: IEEE

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